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Paul W. Marshall
Researcher at Goddard Space Flight Center
Publications - 194
Citations - 5088
Paul W. Marshall is an academic researcher from Goddard Space Flight Center. The author has contributed to research in topics: Heterojunction bipolar transistor & Single event upset. The author has an hindex of 35, co-authored 194 publications receiving 4863 citations.
Papers
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Proceedings ArticleDOI
Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA
Martha V. O'Bryan,C. Poivey,S.D. Kniffin,S.P. Buchner,Ray Ladbury,T.R. Oldham,J.W. Howard,Kenneth A. LaBel,A.B. Sanders,Melanie D. Berg,Cheryl J. Marshall,Paul W. Marshall,Hak Kim,Anthony Dung-phan,D.K. Hawkins,Martin A. Carts,James Forney,T.L. Irwin,Christina Seidleck,S.R. Cox,M. Friendlich,Ryan Flanigan,Dave Petrick,Wes Powell,Jeremy Karsh,Mark P. Baze +25 more
TL;DR: In this paper, a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects are studied. Devices tested include digital, linear bipolar, and hybrid devices, including hybrid devices.
Journal ArticleDOI
Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits
R. Krithivasan,Paul W. Marshall,Mustayeen B. Nayeem,Akil K. Sutton,Wei-Min Kuo,B.M. Haugerud,Laleh Najafizadeh,John D. Cressler,Martin A. Carts,Cheryl J. Marshall,D.L. Hansen,K. Jobe,A.L. McKay,Guofu Niu,Robert A. Reed,B.A. Randall,C.A. Burfield,M.D. Lindberg,Barry K. Gilbert,Erik S. Daniel +19 more
TL;DR: In this paper, both circuit and device-level radiation-hardening-by-design (RHBD) techniques are employed to improve the overall SEU immunity of the shift registers.
Proceedings ArticleDOI
Current single event effects and radiation damage results for candidate spacecraft electronics
M.V. O'Bryan,Ken LaBel,Raymond L. Ladbury,C. Poivey,J.W. Howard,Robert A. Reed,S.D. Kniffin,S. P. Buchner,J.P. Bings,Jeffrey L. Titus,S.D. Clark,T.L. Turflinger,Christina Seidleck,Cheryl J. Marshall,Paul W. Marshall,Hak Kim,D.K. Hawkins,M.A. Carts,J.D. Forney,M.R. Jones,A.B. Sanders,T.L. Irwin,S.R. Cox,Z.A. Kahric,C. Palor,J.A. Sciarini +25 more
TL;DR: In this paper, the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose was presented.
Journal ArticleDOI
An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs
Akil K. Sutton,A.P.G. Prakash,Bongim Jun,Enhai Zhao,Marco Bellini,Jonathan A. Pellish,R.M. Diestelhorst,M.A. Carts,A. Phan,Raymond L. Ladbury,John D. Cressler,Paul W. Marshall,Cheryl J. Marshall,Robert A. Reed,Ronald D. Schrimpf,Daniel M. Fleetwood +15 more
TL;DR: In this article, the authors investigated variations in the total dose tolerance of the emitter-base spacer and shallow trench isolation oxides in a commercial 200 GHz SiGe HBT technology.
Journal ArticleDOI
Energy dependence of proton damage in AlGaAs light-emitting diodes
Robert A. Reed,Paul W. Marshall,Cheryl J. Marshall,Raymond L. Ladbury,Hyun-Chul Kim,Loc Xuan Nguyen,Janet L. Barth,Ken LaBel +7 more
TL;DR: In this paper, the authors measured the energy dependence of proton-induced LED degradation using large numbers of devices and incremental exposures to gain high confidence in the proton energy dependence and device-to-device variability of damage.