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Paul W. Marshall
Researcher at Goddard Space Flight Center
Publications - 194
Citations - 5088
Paul W. Marshall is an academic researcher from Goddard Space Flight Center. The author has contributed to research in topics: Heterojunction bipolar transistor & Single event upset. The author has an hindex of 35, co-authored 194 publications receiving 4863 citations.
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Journal ArticleDOI
A Comparison of the Effects of X-Ray and Proton Irradiation on the Performance of SiGe Precision Voltage References
Laleh Najafizadeh,Akil K. Sutton,R.M. Diestelhorst,Marco Bellini,Bongim Jun,Bongim Jun,John D. Cressler,Paul W. Marshall,Cheryl J. Marshall +8 more
TL;DR: In this paper, a comprehensive investigation of the performance dependencies of irradiated SiGe precision voltage reference circuits on total ionizing dose (TID), circuit topology, and radiation source is presented.
Journal ArticleDOI
The Effects of X-Ray and Proton Irradiation on a 200 GHz/90 GHz Complementary $(npn + pnp)$ SiGe:C HBT Technology
R.M. Diestelhorst,S. Finn,Bongim Jun,Akil K. Sutton,Peng Cheng,Paul W. Marshall,John D. Cressler,Ronald D. Schrimpf,Daniel M. Fleetwood,Hans Gustat,Bernd Heinemann,G.G. Fischer,Dieter Knoll,Bernd Tillack +13 more
TL;DR: In this article, the effects of both X-ray and proton irradiation on a 200 GHz/90 GHz (npn/pnp) complementary SiGe:C HBT was investigated.
Journal ArticleDOI
The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI
Marco Bellini,Bongim Jun,Akil K. Sutton,A. Appaswamy,Peng Cheng,John D. Cressler,Paul W. Marshall,Ronald D. Schrimpf,Daniel M. Fleetwood,B. El-Kareh,S. Balster,P. Steinmann,H. Yasuda +12 more
TL;DR: In this paper, the impact of proton and X-ray induced changes in the forward and inverse Gummel characteristics, the output characteristics, and avalanche multiplication are reported for both npn and pnp SiGe HBTs, at both room temperature (300 K) and at cryogenic temperatures (down to 30 K).
Journal ArticleDOI
Single event effect ground test results for a fiber optic data interconnect and associated electronics
Kenneth A. LaBel,D.K. Hawkins,J.A. Cooley,Christina Seidleck,Paul W. Marshall,C.J. Dale,M.M. Gates,Hak Kim,E.G. Stassinopoulos +8 more
TL;DR: Ground test data and analysis on candidate system components are presented and system level bit error rates become of concern to the system designer.
Journal ArticleDOI
Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Akil K. Sutton,Kurt A. Moen,John D. Cressler,Martin A. Carts,Paul W. Marshall,Jonathan A. Pellish,Vishwa Ramachandran,Robert A. Reed,Michael L. Alles,Guofu Niu +9 more
TL;DR: In this article, the authors present the first experimental results confirming the increased SEE sensitivity of SiGe digital bipolar logic circuits operating in a 63 MeV proton environment at cryogenic temperatures.