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Pawan K. Kulriya

Researcher at Rensselaer Polytechnic Institute

Publications -  139
Citations -  2125

Pawan K. Kulriya is an academic researcher from Rensselaer Polytechnic Institute. The author has contributed to research in topics: Irradiation & Swift heavy ion. The author has an hindex of 25, co-authored 124 publications receiving 1612 citations. Previous affiliations of Pawan K. Kulriya include Jawaharlal Nehru University & Banaras Hindu University.

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Controlled growth of gold nanoparticles induced by ion irradiation: An in situ x-ray diffraction study

TL;DR: In this article, the growth of nanoparticles from 4 (for pristine) to 9nm at a fluence of 1×1014ions∕cm2 was observed, in accordance with the observations made by transmission electron microscopy analyses.
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Highly selective and reversible NO2 gas sensor using vertically aligned MoS2 flake networks.

TL;DR: The VA-MoS2 gas sensor exhibited high response with good reversibility and selectivity towards NO2 as a result of the high aspect ratio as well as high adsorption energy on exposed edge sites.
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Enhanced room temperature ferromagnetism and green photoluminescence in Cu doped ZnO thin film synthesised by neutral beam sputtering

TL;DR: The enhancement in magnetic moment as well as green emission in photoluminescence response with increase in Cu doping indicates that generation of large defects in ZnO by Cu doping, which can be attributed to combined effect of the presence of oxygen vacancies and/or structural inhomogeneity aswell as formation of bound magnetic polarons.
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Radiation-Resistant Behavior of Poly(vinylidene fluoride)/Layered Silicate Nanocomposites

TL;DR: The pitting dimensions and degradation are enhanced significantly beyond 10(11) ions/cm(2) fluence for pristine PVDF, which limits the use of PVDF for any ion irradiation application, and the degradation is considerably suppressed in NCs.
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Hydrogen induced lattice expansion and crystallinity degradation in palladium nanoparticles: Effect of hydrogen concentration, pressure, and temperature

TL;DR: In this paper, a detailed structural study involving in situ glancing angle x-ray diffraction (GAXRD) analysis carried out on Pd nanoparticle and thin film samples at hydrogen concentrations of 2, 5, and 10% over temperature ranging from −100 to 55 °C and hydrogen pressures ranging from 250 to 1000 mbars is reported.