P
Peter G. van Rhee
Researcher at Radboud University Nijmegen
Publications - 4
Citations - 52
Peter G. van Rhee is an academic researcher from Radboud University Nijmegen. The author has contributed to research in topics: Neutron scattering & Plasmon. The author has an hindex of 3, co-authored 3 publications receiving 41 citations. Previous affiliations of Peter G. van Rhee include ASML Holding.
Papers
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Journal ArticleDOI
Alignment of bicelles studied with high-field magnetic birefringence and small-angle neutron scattering measurements.
Marianne Liebi,Peter G. van Rhee,Peter C. M. Christianen,Joachim Kohlbrecher,Peter Fischer,Peter Walde,Erich J. Windhab +6 more
TL;DR: Birefringence measurements at high magnetic field strength of up to 33 T were used to detect magnetically induced alignment of bicelles composed of 1,2-dimyristoyl-sn-glycero-3-phosphocholine (DMPC), cholesterol, and 1, 2-dimYristoyL- Sn-glycerso- 3-Phosphoethanolamine-diethylenetriaminepentaacetate (DMP
Journal ArticleDOI
Self-assembled cdse/cds nanorod sheets studied in the bulk suspension by magnetic alignment
Francesca Pietra,Freddy T. Rabouw,Peter G. van Rhee,Jozef van Rijssel,Andrei V. Petukhov,Ben H. Erné,Peter C. M. Christianen,Celso de Mello Donegá,Daniel Vanmaekelbergh +8 more
TL;DR: In situ results of the structures that spontaneously form in the bulk suspension could further the understanding of NR self-assembly into mono- or multilayer superlattices that occurs at the suspension/air interface upon evaporation of the solvent.
Journal ArticleDOI
High Magnetic Field Magneto-optics on Plasmonic Silica-Embedded Silver Nanoparticles
Alessio Gabbani,Giulio Campo,Valentina Bonanni,Peter G. van Rhee,Gregorio Bottaro,C. de Julián Fernández,Valentina Bello,Elvira Fantechi,Francesco Biccari,Massimo Gurioli,Lidia Armelao,Claudio Sangregorio,Giovanni Mattei,Peter C. M. Christianen,Francesco Pineider +14 more
TL;DR: In this article , a large magnetoplasmonic response of silver nanoparticles was demonstrated by performing magnetic circular dichroism spectroscopy at high magnetic fields, revealing a linear response to the magnetic field up to 30 T.
Proceedings ArticleDOI
Computational metrology: enabling full-lot high-density fingerprint information without adding wafer metrology budget, and driving improved monitoring and process control
Hyun-Sok Kim,Minsung Hyun,Jae-Wuk Ju,Young-Sik Kim,Cees Lambregts,Peter G. van Rhee,Johan Kim,Elliott McNamara,Wim Tjibbo Tel,Paul Böcker,Nang-Lyeom Oh,Jun-Hyung Lee +11 more
TL;DR: A detailed description, discusses the accuracy of the fingerprints computed, and will show results obtained in a DRAM HVM manufacturing environment, and an outlook for improvements and extensions are shared.