Peter Hacke

TL;DR: A new characterization technique for screening PID-susceptible cells during the cell fabrication process using Illuminated Lock-In Thermography was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas.

TL;DR: In this paper, the authors present data from device performance and manufacturing and system installation cost models to quantitatively establish the incentives for manufacturers to pursue advanced (thin) wafer and (high efficiency) cell technologies, in an age of reduced feedstock prices.

TL;DR: In this paper, a single layer polymeric backsheet material has been evaluated for use in silicon PV modules and as a luminescent solar collector and the results reveal the need for continued research in white pigments and positive results in transparent and luminescence backsheet options.

TL;DR: In this paper , current knowledge about PID processes and their impact on the main bifacial modules in the market are gathered with the aim to guide future research. But PID processes are not well understood and extensive research is needed to elucidate the PID scenario and underlying mechanisms.

TL;DR: In this paper, in-house X-ray topography (XRT) is a unique technology that provides a nondestructive way of assessing the mechanical state of encapsulated solar cells, not only the evaluation of cracks and microdefects developed during handling and outdoor operation, but also the analysis of intrinsic deflection and stress induced by materials and processes (e.g., soldering, lamination).