P
Peter Hacke
Researcher at National Renewable Energy Laboratory
Publications - 177
Citations - 5314
Peter Hacke is an academic researcher from National Renewable Energy Laboratory. The author has contributed to research in topics: Potential induced degradation & Photovoltaic system. The author has an hindex of 29, co-authored 159 publications receiving 4561 citations. Previous affiliations of Peter Hacke include University of Chittagong & Applied Materials.
Papers
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Proceedings ArticleDOI
Quantifying solar cell cracks in photovoltaic modules by electroluminescence imaging
TL;DR: In this article, a method for quantifying the percentage of partially and totally disconnected solar cell cracks by analyzing electroluminescence images of the photovoltaic module taken under high and low-current forward bias was proposed.
Proceedings ArticleDOI
Degradation in PV encapsulation transmittance: An interlaboratory study towards a climate-specific test
David C. Miller,Eleonora Annigoni,Amal Ballion,Jayesh G. Bokria,Laura S. Bruckman,David M. Burns,Xinxin Chen,Lamont Elliott,Jiangtao Feng,Roger H. French,Sean Fowler,Xiaohong Gu,Peter Hacke,Christian C. Honeker,Michael D. Kempe,Hussam Khonkar,Michael Köhl,Laure-Emmanuelle Perret-Aebi,Nancy H. Phillips,Kurt P. Scott,Fanny Sculati-Meillaud,Tsuyoshi Shioda,Shigeo Suga,Shin Watanabe,John H. Wohlgemuth +24 more
TL;DR: In this paper, the solar-weighted transmittance, yellowness index, and the UV cut-off wavelength, determined from the measured hemispherical transmittances, are examined to provide understanding and guidance for the UV light source and temperature used in accelerated UV aging tests.
Proceedings ArticleDOI
Combined-Accelerated Stress Testing System for Photovoltaic Modules
TL;DR: This work presents the necessary textbfhardware and textbfsoftware capabilities for developing, implementing, and performing Combined-Accelerated Stress Testing (C-AST) protocols for photovoltaic modules, using off-the-shelf equipment and accessible software development tools, with the aim of supporting the development of C-AST capabilities by the photovolar community.
Journal ArticleDOI
Elucidating PID Degradation Mechanisms and In Situ Dark I–V Monitoring for Modeling Degradation Rate in CdTe Thin-Film Modules
Peter Hacke,Sergiu Spataru,Steve Johnston,Kent Terwilliger,Kaitlyn VanSant,Michael D. Kempe,John H. Wohlgemuth,Sarah Kurtz,Anders Olsson,Michelle Propst +9 more
TL;DR: In this article, a progression of potential-induced degradation (PID) mechanisms is observed in CdTe modules, which are dependent on the stress level and moisture ingress.
Book ChapterDOI
Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules
Peter Hacke,Michael Owen-Bellini,Michel Kempe,David C. Miller,Tadanori Tanahahi,Keiichiro Sakurai,William J. Gambogi,John Trout,Thomas C. Felder,Kaushik Roy Choudhury,Nancy H. Phillips,Michael Koehl,Karl-Anders Weiss,Sergiu Spataru,Christos Monokroussos,Gerhard Mathiak +15 more
TL;DR: Application of stress factors in the combinations and sequences as they occur in the natural environment better reproduces failures seen in the field.