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Peter M. Harris

Researcher at National Physical Laboratory

Publications -  146
Citations -  1932

Peter M. Harris is an academic researcher from National Physical Laboratory. The author has contributed to research in topics: Measurement uncertainty & Software. The author has an hindex of 24, co-authored 137 publications receiving 1762 citations.

Papers
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Evolution of the ‘Guide to the Expression of Uncertainty in Measurement’

TL;DR: This paper summarizes the documents relating to the GUM planned by the Joint Committee for Guides in Metrology and the preparation of further documents for its broad application.
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A low-uncertainty measurement of the Boltzmann constant

TL;DR: In this article, the Boltzmann constant kB was derived from measurements of the speed of sound in argon gas which can be related directly to the mean molecular kinetic energy.

Software Support for Metrology Best Practice Guide No. 6. Uncertainty evaluation.

TL;DR: The emphasis of this guide is on making good use of the GUM, on aspects that yield greater generality, and especially on the provision in some cases of measurement uncertainties that are more objectively based and numerically more sustainable.
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Evaluation of measurement uncertainty based on the propagation of distributions using Monte Carlo simulation.

TL;DR: The current situation of uncertainty evaluation in the context of international norms and arrangements is outlined and an approach to evaluating measurement uncertainty based on the propagation of distributions using Monte Carlo simulation is recommended.
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Recent advances in traceable nanoscale dimension and force metrology in the UK

TL;DR: The UK Government's 2002-2005 Programme for Length as mentioned in this paper funded several groundbreaking projects in low-force metrology, including a traceable areal contacting instrument, the production of the areal transfer artefacts, the development of Internet-based softgauges for profile parameters, a primary low force balance with a force resolution of 50 pN and the development methods for measuring complex micro-scale structures.