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R. Feng

Researcher at Georgia Institute of Technology

Publications -  15
Citations -  5158

R. Feng is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Graphene & Wetting layer. The author has an hindex of 10, co-authored 15 publications receiving 4834 citations.

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Ultrathin epitaxial graphite: 2D electron gas properties and a route toward graphene-based nanoelectronics.

TL;DR: In this paper, ultrathin epitaxial graphite films were grown by thermal decomposition on the (0001) surface of 6H−SiC, and characterized by surface science techniques.
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Electronic structure of epitaxial graphene layers on SIC : Effect of the substrate

TL;DR: In this article, a strong substrate-graphite bond is found in the first all-carbon layer by density functional theory calculations and x-ray diffraction for few graphene layers grown epitaxially on SiC.
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Highly ordered graphene for two dimensional electronics

TL;DR: In this paper, the authors showed that the SiC(0001¯) (C-terminated) surface of a semiconductor can have structural domain sizes more than three times larger than those on the Si face while reducing substrate disorder from sublimation by an order of magnitude.
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Ultrathin epitaxial graphite: 2D electron gas properties and a route toward graphene-based nanoelectronics

TL;DR: In this article, an ultrathin epitaxial graphite graphite (NPEG) was grown by thermal decomposition on the (0001) surface of 6H-SiC and characterized by surface-science techniques.
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Highly-ordered graphene for two dimensional electronics

TL;DR: In this paper, it was shown that Graphene grown from the SiC$(000\bar{1})$ (C-terminated) surface can have structural domain sizes more than three times larger than those grown on the Si-face while reducing substrate disorder from sublimation by an order of magnitude.