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R. Neff

Researcher at University of California, Berkeley

Publications -  5
Citations -  280

R. Neff is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: CMOS & Physical design. The author has an hindex of 5, co-authored 5 publications receiving 278 citations.

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A Top-Down, Constraint-Driven Design Methodology for Analog Integrated Circuits

TL;DR: A top-down, constraint-driven design methodology for analog integrated circuits and some of the tools that support this methodology are described, including behavioral simulation tools, tools for physical assembly, and module generators.
Journal ArticleDOI

Area-efficient multichannel oversampled PCM voice-band coder

TL;DR: It is concluded that for the multichannel telephony voice-band application implemented in CMOS technology, a first-order loop is most area-efficient.
Journal ArticleDOI

A module generator for high-speed CMOS current output digital/analog converters

TL;DR: A module generator (DSYN) creates optimized digital/analog converter (DAC) layouts given a set of specifications including performance constraints, a description of the implementation technology, and aSet of design parameters.
Proceedings ArticleDOI

Top-down, constraint-driven design methodology based generation of n-bit interpolative current source D/A converters

TL;DR: In this article, a top-down, constraint-driven design methodology is proposed to accelerate the design cycle for analog circuits and mixed-signal systems, and a design which demonstrates the two principal advantages that this methodology provides-a high probability for first silicon which meets all specifications and fast design times.
Proceedings ArticleDOI

A module generator for high speed CMOS current output digital/analog converters

TL;DR: A module generator for Digital/Analog Converter (DAC) circuits is presented, using a combination of circuit simulation and DAC design equations to estimate performance and a new constrained optimization method is used to determine design variable values.