S
S. Ashok
Researcher at Pennsylvania State University
Publications - 98
Citations - 1258
S. Ashok is an academic researcher from Pennsylvania State University. The author has contributed to research in topics: Silicon & Ion implantation. The author has an hindex of 17, co-authored 98 publications receiving 1222 citations. Previous affiliations of S. Ashok include Foundation University, Islamabad.
Papers
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Journal ArticleDOI
Harvest of near infrared light in PbSe nanocrystal-polymer hybrid photovoltaic cells
TL;DR: In this paper, a hybrid photovoltaic cell where PbSe nanocrystals were used to sensitize the conjugated polymer into the infrared was reported, and the device exhibited an incident monochromatic photon to current conversion efficiency of 1.3% at λ=805nm.
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Effect of ion‐beam sputter damage on Schottky barrier formation in silicon
TL;DR: In this article, anomalous rectifying behavior has been observed in molybdenum/silicon Schottky barrier diodes produced by ion-beam sputter deposition of Mo on singlecrystal Si.
Patent
Accumulation field effect microelectronic device and process for the formation thereof
TL;DR: In this article, a gated microelectronic device is provided that has a source with a source ohmic contact with the source characterized by a source dopant type and concentration.
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Hydrogen plasma enhancement of boron activation in shallow junctions
TL;DR: In this paper, the authors report on their experimental observations offering evidence for enhancement of electrical activation of implanted boron dopant in the presence of atomic hydrogen in silicon, which is attributed to the creation of vacancies in the implanted region.
Journal ArticleDOI
Low temperature charge carrier hopping transport mechanism in vanadium oxide thin films grown using pulsed dc sputtering
S. S. N. Bharadwaja,Chandrasekaran Venkatasubramanian,N. Fieldhouse,S. Ashok,Mark W. Horn,Thomas N. Jackson +5 more
TL;DR: In this article, the Efros-Shklovskii variable range hopping mechanism was used for low temperature charge transport in vanadium oxide thin films processed using pulsed dc sputtering to understand the correlation between the processing conditions and electrical properties.