S
Sébastien Lambert
Researcher at French Alternative Energies and Atomic Energy Commission
Publications - 9
Citations - 449
Sébastien Lambert is an academic researcher from French Alternative Energies and Atomic Energy Commission. The author has contributed to research in topics: Polishing & X-ray photoelectron spectroscopy. The author has an hindex of 5, co-authored 9 publications receiving 425 citations. Previous affiliations of Sébastien Lambert include Pierre-and-Marie-Curie University & Commissariat à l'énergie atomique et aux énergies alternatives.
Papers
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Journal ArticleDOI
Advanced Mesostructured Hybrid Silica−Nafion Membranes for High-Performance PEM Fuel Cell
Franck Pereira,Karine Valle,Philippe Belleville,Arnaud Morin,Sébastien Lambert,Clément Sanchez +5 more
TL;DR: In this article, the authors describe the elaboration and characterization of new hybrid membranes all the way from the precursor solution to the evaluation of the fuel cell performances, which are extensively characterized with the determination of their physicochemical and electrochemical properties.
Journal ArticleDOI
Nanostructured Hybrid Solar Cells Based on Self-Assembled Mesoporous Titania Thin Films
Emmanuelle Lancelle-Beltran,Philippe Prene,Christophe Boscher,Philippe Belleville,Pierrick Buvat,Sébastien Lambert,François Guillet,Cédric Boissière,David Grosso,Clément Sanchez +9 more
TL;DR: In this paper, a nanocrystalline mesostructured porous titania thin films with optimized coating and thermal curing conditions have been prepared for the first time using spin-coating deposition technique.
Journal ArticleDOI
MgO insulating films prepared by sol–gel route for SiC substrate
Céline Bondoux,Philippe Prene,Philippe Belleville,François Guillet,Sébastien Lambert,Benoît Minot,R. Jérisian +6 more
TL;DR: In this article, the authors evaluated the insulating potentialities of sol-gel MgO films and found that the dielectric strength of the films was microstructure dependent, and reached 5 −8 mV/cm at room temperature.
Journal ArticleDOI
Characterization of the Polishing-Induced Contamination of Fused Silica Optics
Mathilde Pfiffer,Jean-Louis Longuet,Christine Labrugère,Evelyne Fargin,Bruno Bousquet,Marc Dussauze,Sébastien Lambert,Philippe Cormont,Jérôme Néauport +8 more
TL;DR: In this paper, the polishing-induced contamination layer at the fused silica optics surface was studied with various interface analysis techniques: Secondary Ion Mass Spectroscopy (SIMS), Electron Probe Microanalysis (EPMA), X-Ray Photoelectron Spectrograph (XPS), and Inductively Coupled Plasma-Optical Emission Spectrographic (ICP-OES).
Proceedings ArticleDOI
Characterization of the polishing induced contamination of fused silica optics
Mathilde Pfiffer,Jean-Louis Longuet,Christine Labrugère,Evelyne Fargin,Bruno Bousquet,Marc Dussauze,Sébastien Lambert,Philippe Cormont,Jérôme Néauport +8 more
TL;DR: In this paper, secondary ion mass spectroscopy (SIMS), Electron Probe Micro Analysis (EPMA), and X-Ray PhotoelectronSpectroscopy were used to analyze the polishing induced contamination layer at the fused silica optics surface.