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Shi-Li Zhang

Researcher at Uppsala University

Publications -  213
Citations -  3651

Shi-Li Zhang is an academic researcher from Uppsala University. The author has contributed to research in topics: Transistor & Silicide. The author has an hindex of 28, co-authored 206 publications receiving 3188 citations. Previous affiliations of Shi-Li Zhang include Royal Institute of Technology.

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Metal silicides in CMOS technology : Past, present, and future trends

TL;DR: The metal silicides have played an indispensable role in the rapid development of microelectronics since PtSi was first used to improve the rectifying characteristics of diodes in early 1960s as discussed by the authors.
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A Comparative Study of Two Different Schemes to Dopant Segregation at NiSi/Si and PtSi/Si Interfaces for Schottky Barrier Height Lowering

TL;DR: In this article, the Schottky barrier height (SBH) of the contact systems of NiSi and PtSi was compared with two different schemes used to incorporate a high concentration of dopants at the silicide/silicon interface.
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Finite-size scaling in stick percolation

TL;DR: A high-efficiency algorithm for Monte Carlo simulations is developed to investigate, with extensive realizations, the finite-size scaling behavior of stick percolation in large-size systems and results indicate that the spanning probability of stickPercolation on square systems with free boundary conditions falls on the same universal scaling function as that for lattice percolations.
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Scalable inkjet printing of shear-exfoliated graphene transparent conductive films

TL;DR: In this article, a scalable and efficient inkjet printing of graphene flexible transparent conducting films (TCFs) is demonstrated, where the highly concentrated and stable graphene ink (3.2 mg/mL) that is dominated by 4-layer graphene flakes is achieved by means of shear exfoliation process.
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Schottky-Barrier Height Tuning by Means of Ion Implantation Into Preformed Silicide Films Followed by Drive-In Anneal

TL;DR: An experimental study on Schottky-barrier height tuning using ion implantation followed by drive-in anneal of As, B, In, and P in preformed NiSi and PtSi films is presented in this paper.