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Shinichi Takigawa
Researcher at Panasonic
Publications - 82
Citations - 1080
Shinichi Takigawa is an academic researcher from Panasonic. The author has contributed to research in topics: Laser & Semiconductor laser theory. The author has an hindex of 15, co-authored 81 publications receiving 1016 citations. Previous affiliations of Shinichi Takigawa include Kyoto University.
Papers
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Journal ArticleDOI
Continuous Wave Operation of GaN Vertical Cavity Surface Emitting Lasers at Room Temperature
Toshikazu Onishi,Osamu Imafuji,Kentaro Nagamatsu,Masao Kawaguchi,Kazuhiko Yamanaka,Shinichi Takigawa +5 more
TL;DR: In this paper, the authors report on continuous wave lasing characteristics of GaN vertical cavity surface emitting lasers (VCSELs), which operate at room temperature under current injection by using highly reflective distributed Bragg reflectors.
Patent
Semiconductor light-emitting device and method for fabricating the same
Daisuke Ueda,Shinichi Takigawa +1 more
TL;DR: In this paper, an n-type buffer layer composed of undoped GaInN, a p-type optical confinement layer, a P-type cladding layer, and a contact layer are formed on a substrate composed of sapphire.
Journal ArticleDOI
High-extraction-efficiency blue light-emitting diode using extended-pitch photonic crystal
Kenji Orita,Satoshi Tamura,Toshiyuki Takizawa,Tetsuzo Ueda,Masaaki Yuri,Shinichi Takigawa,Daisuke Ueda +6 more
TL;DR: In this paper, the surface photonic crystal (PhC) was integrated on GaN-based blue light-emitting diodes (LEDs) for the first time in order to enhance the extraction efficiency of the LEDs.
Journal ArticleDOI
Analysis of Diffusion-Related Gradual Degradation of InGaN-Based Laser Diodes
Kenji Orita,Matteo Meneghini,Hiroshi Ohno,Nicola Trivellin,N. Ikedo,Shinichi Takigawa,Masaaki Yuri,Tsuneo Tanaka,Enrico Zanoni,Gaudenzio Meneghesso +9 more
TL;DR: In this article, the authors investigated the role of nonradiative recombination centers (NRCs) and threshold carrier density (threshold carrier density Nth) in the degradation of InGaN-based laser diodes.
Journal ArticleDOI
Investigation of the deep level involved in InGaN laser degradation by deep level transient spectroscopy
Matteo Meneghini,C. De Santi,Nicola Trivellin,Kenji Orita,Shinichi Takigawa,Tsuneo Tanaka,Daisuke Ueda,Gaudenzio Meneghesso,Enrico Zanoni +8 more
TL;DR: In this paper, an extensive analysis of the properties of the deep level responsible for the degradation of InGaN-based laser diodes is presented based on combined optical measurements and Deep-Level Transient Spectroscopy (DLTS) investigation.