1. Introduction 2. Theoretical foundations 3. Propagation and focusing of optical fields 4. Spatial resolution and position accuracy 5. Nanoscale optical microscopy 6. Near-field optical probes 7. Probe-sample distance control 8. Light emission and optical interaction in nanoscale environments 9. Quantum emitters 10. Dipole emission near planar interfaces 11. Photonic crystals and resonators 12. Surface plasmons 13. Forces in confined fields 14. Fluctuation-induced phenomena 15. Theoretical methods in nano-optics Appendices Index.

/pdf/principles-of-nano-optics-1hz998yqo8.pdf

Principles of nano-optics

Graphene has shown great application potential as the hostmaterial for next-generation electronic devices. However, despite itsintriguing properties, one of the biggest hurdles for graphene to beuseful as an electronic material is the lack of an energy gap in itselectronic spectra. This, for example, prevents the use of graphene inmaking transistors. Although several proposals have been made to open agap in graphene's electronic spectra, they all require complexengineering of the graphene layer. Here, we show that when graphene isepitaxially grown on SiC substrate, a gap of ~;0.26 eV is produced. Thisgap decreases as the sample thickness increases and eventually approacheszero when the number of layers exceeds four. We propose that the originof this gap is the breaking of sublattice symmetry owing to thegraphene-substrate interaction. We believe that our results highlight apromising direction for band gap engineering of graphene.

/pdf/substrate-induced-bandgap-opening-in-epitaxial-graphene-1e68nmhrn3.pdf

Substrate-induced bandgap opening in epitaxial graphene

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.

https://hep.physics.utoronto.ca/WilliamTrischuk/courses/phy189/AFM_revmodphys.pdf

Advances in atomic force microscopy

Dynamic atomic force microscopy methods

Graphene has shown great application potentials as the host material for next generation electronic devices. However, despite its intriguing properties, one of the biggest hurdles for graphene to be useful as an electronic material is its lacking of an energy gap in the electronic spectra. This, for example, prevents the use of graphene in making transistors. Although several proposals have been made to open a gap in graphene's electronic spectra, they all require complex engineering of the graphene layer. Here we show that when graphene is epitaxially grown on the SiC substrate, a gap of ~ 0.26 is produced. This gap decreases as the sample thickness increases and eventually approaches zero when the number of layers exceeds four. We propose that the origin of this gap is the breaking of sublattice symmetry owing to the graphene-substrate interaction. We believe our results highlight a promising direction for band gap engineering of graphene.

Substrate-induced band gap opening in epitaxial graphene

The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7x7), two crescents with a spherical envelope. The crescents are interpreted as images of two atomic orbitals of the front atom of the tip. Key for the observation of these subatomic features is a force-detection scheme with superior noise performance and enhanced sensitivity to short-range forces.

/pdf/subatomic-features-on-the-silicon-111-7-7-surface-observed-17g78jiw3a.pdf

Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Carbon, the backbone material of life on Earth, comes in three modifications: diamond, graphite, and fullerenes. Diamond develops tetrahedral sp3 bonds, forming a cubic crystal structure, whereas graphite and fullerenes are characterized by planar sp2 bonds. Polycrystalline graphite is the basis for many products of everyday life: pencils, lubricants, batteries, arc lamps, and brushes for electric motors. In crystalline form, highly oriented pyrolytic graphite is used as a diffracting element in monochromators for x-ray and neutron scattering and as a calibration standard for scanning tunneling microscopy (STM). The graphite surface is easily prepared as a clean atomically flat surface by cleavage. This feature is attractive and is used in many laboratories as the surface of choice for “seeing atoms.” Despite the proverbial ease of imaging graphite by STM with atomic resolution, every second atom in the hexagonal surface unit cell remains hidden, and STM images show only a single atom in the unit cell. Here we present measurements with a low-temperature atomic force microscope with pico-Newton force sensitivity that reveal the hidden surface atom.

https://www.pnas.org/content/pnas/100/22/12539.full.pdf

Revealing the hidden atom in graphite by low-temperature atomic force microscopy

The charge distribution in atoms with closed electron shells is spherically symmetric, whereas atoms with partially filled shells can form covalent bonds with pointed lobes of increased charge density. Covalent bonding in the bulk can also affect surface atoms, leading to four tiny humps spaced by less than 100 picometers in the charge density of adatoms on a (001) tungsten surface. We imaged these charge distributions by means of atomic force microscopy with the use of a light-atom probe (a graphite atom), which directly measured high-order force derivatives of its interaction with a tungsten tip. This process revealed features with a lateral distance of only 77 picometers.

/pdf/force-microscopy-with-light-atom-probes-2co1nq4nap.pdf

Stefan Hembacher

Papers

Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Revealing the hidden atom in graphite by low-temperature atomic force microscopy

Force microscopy with light-atom probes.

Force Microscopy with Light Atom Probes