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Stein Kuiper

Researcher at Philips

Publications -  102
Citations -  4056

Stein Kuiper is an academic researcher from Philips. The author has contributed to research in topics: Lens (optics) & Electrowetting. The author has an hindex of 29, co-authored 102 publications receiving 3961 citations. Previous affiliations of Stein Kuiper include University of Twente.

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Journal ArticleDOI

Variable-focus liquid lens for miniature cameras

TL;DR: In this paper, it was demonstrated that two immiscible liquids in a tube form a self-centered lens with a high optical quality, and the motion of the lens during a focusing action was studied by observation through the transparent tube wall.
Patent

Variable focus lens

TL;DR: A variable focus lens comprising a first fluid and a second non-miscible fluid in contact over a meniscus is described in this paper, where the fluid contact layer has a substantially cylindrical inner wall.
Journal ArticleDOI

Development and applications of very high flux microfiltration membranes

TL;DR: Inorganic microfiltration membranes with a pore size down to 0.1?m have been made using laser interference lithography and silicon micro machining technology as mentioned in this paper, which is relatively insensible to fouling, because they have a smooth surface, short pore channels and because they can be operated in cross flow configuration at very low transmembrane pressures.
Journal ArticleDOI

Electrowetting-Based Variable-Focus Lens for Miniature Systems

TL;DR: In this article, a self-centred variable-focus lens between two immiscible liquids of different refractive indices was used as a lens for mobile applications, and the lens was applied in a Blu-ray Disc optical recording system to enable dual layer disc reading/writing.
Journal ArticleDOI

Resistless patterning of sub-micron structures by evaporation through nanostencils

TL;DR: In this article, a shadow mask evaporation technique for single-layer material patterning is described, which does not involve photoresist processing steps and is therefore applicable on arbitrary surfaces.