T
Thierry Parra
Researcher at University of Toulouse
Publications - 68
Citations - 697
Thierry Parra is an academic researcher from University of Toulouse. The author has contributed to research in topics: Noise figure & Balun. The author has an hindex of 13, co-authored 65 publications receiving 662 citations. Previous affiliations of Thierry Parra include Hoffmann-La Roche & Paul Sabatier University.
Papers
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Journal ArticleDOI
A 5.4 mW/0.07 mm $^{2}$ 2.4 GHz Front-End Receiver in 90 nm CMOS for IEEE 802.15.4 WPAN Standard
TL;DR: An integrated 2.4 GHz CMOS receiver front-end according to the IEEE 802.15.4 standard is presented, based on a 6 MHz low-IF topology, which uses an inductorless LNA and a new clocking scheme for driving a passive mixer.
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Noise in AlGaAs/InGaAs/GaAs pseudomorphic HEMTs from 10 Hz to 18 GHz
TL;DR: In this article, the noise properties of pseudomorphic HEMTs were investigated in the low and intermediate frequency range (10 Hz to 150 MHz) and in the microwave range (4 to 18 GHz).
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An improved method for the wave propagation constant ? estimation in broadband uniform millimeter-wave transmission line
TL;DR: In this article, a new method is derived for computing the wave propagation constant γ of a uniform transmission line based on the properties of a similar and unitary matrix, and allows us to minimize the errors due to connection repeatability.
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Design of an original K-band active balun with improved broadband balanced behavior
TL;DR: In this article, an active balun exhibiting a single-ended input and balanced outputs is designed based on the determination of specific impedance for connecting the differential transistor pair to ground, which greatly improves the balanced behavior over a broadband frequency range.
Proceedings Article
Dielectric microwave characterization of the SU-8 thick resin used in an above IC process
TL;DR: In this paper, a broadband technique for determining electrical properties of dielectric materials is presented, based on microstrip lines, and relative permittivity and loss tangent are computed from S-parameter measurements and analytical equations.