T
Tino Wagner
Researcher at ETH Zurich
Publications - 12
Citations - 393
Tino Wagner is an academic researcher from ETH Zurich. The author has contributed to research in topics: Kelvin probe force microscope & Contact resistance. The author has an hindex of 7, co-authored 12 publications receiving 257 citations.
Papers
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Journal ArticleDOI
Large Pockels effect in micro- and nanostructured barium titanate integrated on silicon
Stefan Abel,Felix Eltes,J. Elliott Ortmann,Andreas Messner,P. Castéra,Tino Wagner,Darius Urbonas,Alvaro Rosa,A. M. Gutierrez,Domenico Tulli,Ping Ma,Benedikt Baeuerle,Arne Josten,Wolfgang Heni,Daniele Caimi,Lukas Czornomaz,Alexander A. Demkov,Juerg Leuthold,Pablo Sanchis,Jean Fompeyrine +19 more
TL;DR: It is proved that the Pockels effect remains strong even in nanoscale devices, and shown as a practical example data modulation up to 50 Gbit s−1.
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
Tino Wagner,Hannes Beyer,Patrick A. Reissner,Philipp Mensch,Heike Riel,Bernd Gotsmann,Andreas Stemmer +6 more
TL;DR: A novel FM-KFM controller based on a Kalman filter and direct demodulation of sidebands is introduced and discussed, which enables robust amplitude modulated topography feedback and minimal crosstalk.
Journal ArticleDOI
Thermal Conductivity of a Supported Multiwalled Carbon Nanotube
Fabian Könemann,Morten Vollmann,Tino Wagner,Norizzawati Mohd Ghazali,Tomohiro Yamaguchi,Andreas Stemmer,Koji Ishibashi,Bernd Gotsmann +7 more
TL;DR: In this article, the authors extracted temperature-dependent thermal conductivity values from scanning thermal microscopy measurements of a self-heated multi-walled carbon nanotube supported on a silicon substrate.
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Probing the local surface potential and quantum capacitance in single and multi-layer graphene
TL;DR: In this article, the surface potential and quantum capacitance in single layer graphene as well as multilayers thereof were measured by using frequency-modulated Kelvin probe force microscopy.
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Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire.
TL;DR: Here, measurements by scanning thermal and Kelvin probe force microscopy of the same 60 nm diameter indium arsenide nanowire in operation are shown and a device model is obtained permitting separate extraction of the local thermal nanowires and interface conductivities.