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Todd C. Schwendemann

Researcher at Southern Connecticut State University

Publications -  18
Citations -  595

Todd C. Schwendemann is an academic researcher from Southern Connecticut State University. The author has contributed to research in topics: Conductive atomic force microscopy & Scanning tunneling microscope. The author has an hindex of 10, co-authored 18 publications receiving 562 citations. Previous affiliations of Todd C. Schwendemann include Yale University.

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Three-dimensional imaging of short-range chemical forces with picometre resolution

TL;DR: This work shows force maps with picometre and piconewton resolution that allow a detailed characterization of the interaction between the surface and the tip of the microscope in three dimensions, and suggests that the excellent lubrication properties of graphite may be due to a significant localization of the lateral forces.
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Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.

TL;DR: The design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscope (NC-AFM) modes are presented.
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Three-dimensional atomic force microscopy - taking surface imaging to the next level.

TL;DR: Based on noncontact atomic force microscopy, 3D-AFM is able to provide more detailed information on surface properties than ever before, thanks to the simultaneous multi-channel acquisition of complementary spatial data such as local energy dissipation and tunneling currents.
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Understanding scanning tunneling microscopy contrast mechanisms on metal oxides: a case study.

TL;DR: It is found that depending on the bias voltage polarity, copper-terminated tips allow selective imaging of two structurally distinct surface Cu sites, while oxygen- terminated tips show complex contrasts with pronounced asymmetry and tip-sample distance dependence, which provides a conclusive understanding of fundamental STM imaging mechanisms.
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Achieving A-Site Termination on La0.18Sr0.82Al0.59Ta0.41O3 Substrates

TL;DR: SrTiO 3 (STO), which is closely lattice matched to many transition metal oxides, is extensively used in part because TiO 2 -terminated surfaces exhibiting singleunit-cell steps can be achieved through etching and annealing techniques.