Torsten Fritz

TL;DR: In this article, an in situ growth study of an organic layer on a salt substrate, displaying surprisingly sharp optical transitions already at room temperature, was performed by using noncontact atomic force microscopy (AFM) and advanced potential energy calculations.

TL;DR: In this paper, a sensitive setup capable of measuring the optical properties of ultrathin organic molecular crystals via differential reflectance spectroscopy (DRS) is presented, which allows to carry out measurements in situ, i.e., during the actual film growth, and over a wide spectral range, even on single crystalline surfaces with high symmetry or metallic surfaces.

TL;DR: This Perspective will give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to several monolayers, as a tool to study the absorption behavior of such films and emphasize the relations between the physical layer structure and the resulting optical properties.

TL;DR: A new type of epitaxy, line-on-line coincidence (LOL), which explains the ordering in the organic-organic heterolayer system PTCDA on HBC on graphite is proposed, characterized by a minimum in the overlayer-substrate interaction potential.

TL;DR: Differential reflectance spectroscopy (DRS) is a powerful tool to study in depth manifold physical processes occurring in molecular solids, at interfaces between molecules and substrates, and at interfaces interfaces between different molecular species as discussed by the authors.