T
Toyoaki Eguchi
Researcher at Tohoku University
Publications - 96
Citations - 1691
Toyoaki Eguchi is an academic researcher from Tohoku University. The author has contributed to research in topics: Scanning tunneling microscope & Scanning tunneling spectroscopy. The author has an hindex of 22, co-authored 94 publications receiving 1540 citations. Previous affiliations of Toyoaki Eguchi include Waseda University & Keio University.
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Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators
TL;DR: In this article, the authors calculate and measure the noise characteristics of self-sensing quartz sensors and find four noise sources: deflection detector noise, thermal noise, oscillator noise, and thermal drift noise.
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Superconducting Pb island nanostructures studied by scanning tunneling microscopy and spectroscopy
Takahiro Nishio,Toshu An,Atsushi Nomura,Kousuke Miyachi,Toyoaki Eguchi,Hideaki Sakata,Shi-Zeng Lin,Nobuhiko Hayashi,Noriyuki Nakai,Masahiko Machida,Yukio Hasegawa +10 more
TL;DR: Superconductivity of nanosized Pb-island structures whose radius is 0.8 to 2.5 times their coherence length was studied under magnetic fields using low-temperature scanning tunneling microscopy and spectroscopy.
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Cu-TBPP and PTCDA molecules on insulating surfaces studied by ultra-high-vacuum non-contact AFM
Laurent Nony,Laurent Nony,Roland Bennewitz,Oliver Pfeiffer,Enrico Gnecco,Alexis Baratoff,Ernst Meyer,Toyoaki Eguchi,André Gourdon,Christian Joachim +9 more
TL;DR: In this article, the adsorption of two kinds of porphyrin (Cu-TBPP) and perylene (PTCDA) derived organic molecules was studied by noncontact force microscopy in ultra-high vacuum, the goal being the assembly of ordered molecular arrangements on insulating surfaces at room temperature.
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Imaging of all Dangling Bonds and their Potential on the Ge/Si(105) Surface by Noncontact Atomic Force Microscopy
Toyoaki Eguchi,Yasunori Fujikawa,Kotone Akiyama,Kotone Akiyama,Toshu An,Toshu An,Masanori Ono,T. Hashimoto,Yoshitada Morikawa,Kiyoyuki Terakura,Toshio Sakurai,Max G. Lagally,Yukio Hasegawa,Yukio Hasegawa +13 more
TL;DR: High-resolution noncontact atomic force microscope images were successfully taken on the Ge105-(1 x 2) structure formed on the Si105 substrate and revealed all dangling bonds of the surface regardless of their electronic situation, surpassing scanning tunneling microscopy, whose images strongly deviated from the atomic structure by the electronic states involved.
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High resolution atomic force microscopic imaging of the Si(111)-(7 x 7) surface: contribution of short-range force to the images.
Toyoaki Eguchi,Yukio Hasegawa +1 more
TL;DR: Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.