V
V. R. K. Murthy
Researcher at Indian Institute of Technology Madras
Publications - 165
Citations - 2887
V. R. K. Murthy is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Dielectric & Rietveld refinement. The author has an hindex of 27, co-authored 162 publications receiving 2595 citations. Previous affiliations of V. R. K. Murthy include VIT University & Indian Institute of Science.
Papers
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Microwave power loss and XPS measurements on high Tc NdBaCuOxide superconducting system
TL;DR: The T c of NdBa 2 Cu 3 O x systaem was found to be 81 K by a microwave power loss measurements as discussed by the authors, and the XPS data donot provide conclusive evidence for the presence of Cu 3+ and the oxygen vacancies are associated with Cu and Ba ions.
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Structure analysis on the Ba3Mg(Ta1−xNbx)2O9 ceramics: Coexistence of order and disorder
TL;DR: In this article, the effect of Nb 5+ at the Ta 5+ site on the BMT structure was analyzed using the Rietveld technique on the X-ray powder diffraction data.
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Effect of steric hindrance of ketones in the dielectric relaxation of methanol+ketone systems
TL;DR: In this paper, the reorientation activation energies of five methanol+ketone systems were determined from the study of the variation of dielectric permittivity with temperature between 303 to 333 k at X band frequency.
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Dielectric and Raman studies of (BaxPb1−x)(Yb0.5Nb0.5)O3
TL;DR: In this article, Raman spectra of the solid solution series (BaxPb1−x)(Yb0.5Nb 0.5)O3 from x = 0.0 to 0.3 have been analyzed and a new mode at 420 cm−1 is observed for the compounds with Ba2+ substitution.
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New approach for measuring the microwave Hall mobility of semiconductors
TL;DR: In this paper, the authors present a new approach that removes the disadvantage of having high error values primarily due to the problem in evaluating the calibration constant of the whole experimental arrangement, and present a calibration constant with 1% accuracy.