V
V. R. K. Murthy
Researcher at Indian Institute of Technology Madras
Publications - 165
Citations - 2887
V. R. K. Murthy is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Dielectric & Rietveld refinement. The author has an hindex of 27, co-authored 162 publications receiving 2595 citations. Previous affiliations of V. R. K. Murthy include VIT University & Indian Institute of Science.
Papers
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X-ray photoelectron spectroscopic study of some pure stages of graphite ferric chloride intercalation compounds
TL;DR: In this article, the binding energy of graphite ferric chloride intercalation compounds (FeCl3-GICs) has been investigated using X-ray photoelectron spectroscopic (XPS) analysis.
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Origin of magnetocapacitance in chemically homogeneous and inhomogeneous ferrites.
TL;DR: The present work mainly focuses on the magnetodielectric effect in polycrystalline Ni0.9-yCuyZn0.1Fe1.98O3.5 ferrite synthesized by a solid-state reaction method, which showed the formation of CuO-rich grain boundary segregation in the present material chemically inhomogeneous and electrically heterogeneous.
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Long range B-site cation ordering and Briet–Wigner–Fano line shape of A1g-like Raman mode in Nd1−xSmx(Mg0.5Ti0.5)O3 microwave dielectric ceramics
TL;DR: In this article, the A 1g-like mode in Raman spectra was observed to possess Briet-Wigner-Fano line shape, which supported 1:1 B-site cation ordering and long range ordering (LRO) parameter decreased up to x ǫ = 0.5 and then increased with further increase in Sm concentration.
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Synthesis and role of Nd and Sm on the microwave dielectric properties of BaNd2(1 − x)Sm2xTi5O14 dielectric resonator
TL;DR: In this paper, the dielectric properties of a D resonator with x = 0.7 were studied by adjusting the Nd/Sm ratio, which gave high ǫ r, high Q and low τ f.
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Microwave dielectric relaxation studies of hydrogen bonded polar binary mixtures of isobutanol and aniline
T. Vishwam,V. R. K. Murthy +1 more
TL;DR: In this article, the frequency dependent complex dielectric permittivity was determined by using the open-ended coaxial probe technique method in the microwave frequency range from 20 MHz to 20 GHz.