V
Victor Khilkevich
Researcher at Missouri University of Science and Technology
Publications - 80
Citations - 870
Victor Khilkevich is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Electromagnetic interference & Near and far field. The author has an hindex of 13, co-authored 71 publications receiving 533 citations. Previous affiliations of Victor Khilkevich include University of Missouri.
Papers
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An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application
TL;DR: This paper presents a fast and efficient calibration method which uses the same setup and instruments during calibration and measurement, and it allows for easy and economical integration of the calibration hardware and software into the scanning system.
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Estimating Radio-Frequency Interference to an Antenna Due to Near-Field Coupling Using Decomposition Method Based on Reciprocity
TL;DR: In this article, an effective methodology is proposed to estimate the RF interference received by an antenna due to near-field coupling, which is one of the common noise-coupling mechanisms, using decomposition method based on reciprocity.
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Radiated EMI Estimation From DC–DC Converters With Attached Cables Based on Terminal Equivalent Circuit Modeling
Satyajeet Shinde,Kohei Masuda,Guangyao Shen,Abhishek Patnaik,Tamar Makharashvili,David Pommerenke,Victor Khilkevich +6 more
TL;DR: An equivalent two terminal model based on the Thevenin equivalents describes the common mode (CM) currents on the input and output side of two widely used types of dc-to-dc power converters as mentioned in this paper.
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Emission Source Microscopy Technique for EMI Source Localization
TL;DR: In this paper, an emission source microscopy (ESM) technique derived from synthetic aperture radar (SAR) was used to localize radiating sources on a complex PCB.
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Maximum Radiated Emissions Evaluation for the Heatsink/IC Structure Using the Measured Near Electrical Field
TL;DR: In this paper, the maximum radiated emissions for a heat-sink/IC structure is predicted by creating an equivalent source from the measured electrical field (E-field) in the gap between the heatsink and IC.