D
David Pommerenke
Researcher at Graz University of Technology
Publications - 466
Citations - 5688
David Pommerenke is an academic researcher from Graz University of Technology. The author has contributed to research in topics: Electrostatic discharge & Electromagnetic compatibility. The author has an hindex of 32, co-authored 441 publications receiving 4802 citations. Previous affiliations of David Pommerenke include Technical University of Berlin & Missouri University of Science and Technology.
Papers
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ESD: transient fields, arc simulation and rise time limit
TL;DR: In this paper, it is shown that the arc resistance law by Rompe and Weizel and an electron avalanche model can be applied in ESD simulations and a lower rise time limit of approx. 20 ps can be calculated.
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Numerical modeling of electrostatic discharge generators
TL;DR: In this paper, the discharge current and the transient fields of an ESD generator in the contact mode are numerically simulated using the finite-difference time-domain method, and the simulated data are used to study the effect of design choices on the current and fields.
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An efficient approach for power delivery network design with closed-form expressions for parasitic interconnect inductances
Chen Wang,Jingkun Mao,G. Selli,Shaofeng Luan,Lin Zhang,Jun Fan,David Pommerenke,Richard E. DuBroff,James L. Drewniak +8 more
TL;DR: In this article, the authors proposed a closed-form expression for the parasitics associated with the interconnects of the decoupling capacitors of a dc power distribution network.
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Portable Real-Time Microwave Camera at 24 GHz
TL;DR: A microwave camera built upon a two-dimensional array of switchable slot antennas that borrows from modulated scattering techniques to improve isolation among the array elements thus reducing the complexity, cost and size of the array.
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ESD: waveform calculation, field and current of human and simulator ESD
David Pommerenke,Martin Aidam +1 more
TL;DR: In this paper, the authors compared human ESD current, current derivatives and transient fields with those caused by commercial simulators and provided suggestions for possible improvements of ESD test standards.