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Vitaliy Avrutin

Researcher at Virginia Commonwealth University

Publications -  148
Citations -  13502

Vitaliy Avrutin is an academic researcher from Virginia Commonwealth University. The author has contributed to research in topics: Molecular beam epitaxy & Thin film. The author has an hindex of 28, co-authored 129 publications receiving 12324 citations. Previous affiliations of Vitaliy Avrutin include Rutgers University & University of Ulm.

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A comprehensive review of zno materials and devices

TL;DR: The semiconductor ZnO has gained substantial interest in the research community in part because of its large exciton binding energy (60meV) which could lead to lasing action based on exciton recombination even above room temperature.
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Transparent conducting oxides for electrode applications in light emitting and absorbing devices

TL;DR: In this paper, the authors review the latest developments in and properties of transparent conducting oxides (TCO), particularly in relation to thin film transparent electrode applications for LEDs and solar cells.
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Doping Asymmetry Problem in ZnO: Current Status and Outlook

TL;DR: A critical review of the current experimental efforts focused on achieving p-type ZnO is provided and the proposed approaches which could possibly be used to overcome the p- type problem are discussed.

Doping Asymmetry Problem in ZnO: Current Status and Outlook. A Review of Experimental and Theoretical Efforts Focused on Achieving P-Type ZnO Suitable for Light-Emitting Optoelectronic Devices for the Blue/Ultraviolet Spectral Range

TL;DR: In this paper, the authors provide a critical review of the current experimental efforts focused on achieving p-type ZnO and discuss the proposed approaches which could possibly be used to overcome the doping asymmetry problem.
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Micro-LEDs, a Manufacturability Perspective

TL;DR: In this article, the authors review the recent technological developments of micro-LEDs from various aspects, including efficient and reliable assembly of individual LED dies into addressable arrays, full-color schemes, defect and yield management, repair technology and cost control.