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W. Ted Masselink

Researcher at Humboldt University of Berlin

Publications -  53
Citations -  1410

W. Ted Masselink is an academic researcher from Humboldt University of Berlin. The author has contributed to research in topics: Laser & Molecular beam epitaxy. The author has an hindex of 13, co-authored 53 publications receiving 1149 citations. Previous affiliations of W. Ted Masselink include Humboldt State University.

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Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride

TL;DR: The investigation shows how sensitive the refractive index functions are to the O2 and N2 flow rates, and for which growth conditions the materials deposit homogeneously, and allows conclusions to be drawn on the degree of amorphousness and roughness.
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Second harmonic generation in gallium phosphide photonic crystal nanocavities with ultralow continuous wave pump power

TL;DR: Second harmonic generation in photonic crystal nanocavities fabricated in the semiconductor gallium phosphide is demonstrated, promising for integrated, low-power light sources and on-chip reduction of input power in other nonlinear processes.
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Monolithically Integrated InAs/GaAs Quantum Dot Mid-Infrared Photodetectors on Silicon Substrates

TL;DR: In this paper, the first InAs/GaAs quantum dot (QD) infrared photodetectors were integrated on silicon substrates by molecular beam epitaxy, which reduced the threading dislocation density to ∼106 cm-2.
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Lithographic positioning of fluorescent molecules on high-Q photonic crystal cavities

TL;DR: In this paper, photoluminescent molecules are coupled to high quality photonic crystal nanocavities, which are fabricated in a gallium phosphide membrane and show resonances from 735 to 860 nm.

Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride. Appl. Opt. 51, 6789-6798

TL;DR: In this article, the complex refractive index components, n and k, have been studied for thin films of several common dielectric materials with a low to medium this article as functions of wavelength and stoichiometry for mid-infrared (MIR) wavelengths within the range 1.54-14.29 μm.