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Yuri V. Flores
Researcher at Massachusetts Institute of Technology
Publications - 32
Citations - 1113
Yuri V. Flores is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Laser & Scattering. The author has an hindex of 11, co-authored 32 publications receiving 873 citations. Previous affiliations of Yuri V. Flores include Humboldt State University & Humboldt University of Berlin.
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Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride
Jan Kischkat,Sven Peters,Bernd Gruska,Mykhaylo P. Semtsiv,Mikaela Chashnikova,Matthias Klinkmüller,O. Fedosenko,S. Machulik,A. Aleksandrova,Gregorii Monastyrskyi,Yuri V. Flores,W. Ted Masselink +11 more
TL;DR: The investigation shows how sensitive the refractive index functions are to the O2 and N2 flow rates, and for which growth conditions the materials deposit homogeneously, and allows conclusions to be drawn on the degree of amorphousness and roughness.
Journal ArticleDOI
High-efficiency, high-power mid-infrared quantum cascade lasers [Invited]
Dan Botez,Jeremy Kirch,C. Boyle,K. Oresick,C. Sigler,Honghyuk Kim,B. Knipfer,Jae Ha Ryu,D. Lindberg,Tom Earles,Luke J. Mawst,Yuri V. Flores +11 more
TL;DR: In this paper, the step-taper active region (STA) design concept is implemented for ~5.0 μm-emitting quantum cascade lasers (QCLs) grown by metal-organic chemical vapor deposition (MOCVD), and high characteristic temperatures for the threshold-current density Jth, T0, and for the slope efficiency ηsl, T1: 226 K and 653 K.
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Low-threshold intersubband laser based on interface-scattering-rate engineering
Mykhaylo P. Semtsiv,Yuri V. Flores,Mikaela Chashnikova,G. Monastyrskyi,William Ted Masselink +4 more
TL;DR: In this article, the dependence of the scattering rate between different electronic states in semiconductor heterostructures due to interface roughness on the barrier height is exploited to enhance the population inversion in inter-subband lasers.
Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride. Appl. Opt. 51, 6789-6798
Jan Kischkat,Sven Peters,Bernd Gruska,Mykhaylo P. Semtsiv,Mikaela Chashnikova,Matthias Klinkmüller,O. Fedosenko,S. Machulik,A. Aleksandrova,Gregorii Monastyrskyi,Yuri V. Flores,W. Ted Masselink +11 more
TL;DR: In this article, the complex refractive index components, n and k, have been studied for thin films of several common dielectric materials with a low to medium this article as functions of wavelength and stoichiometry for mid-infrared (MIR) wavelengths within the range 1.54-14.29 μm.
Journal ArticleDOI
Two-well terahertz quantum cascade lasers with suppressed carrier leakage
TL;DR: In this article, a two-quantum-well direct-phonon quantum cascade laser (THz-QCL) was proposed to suppress the thermally activated carrier leakage into the continuum with the increase in the injection barrier height.