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Xiaokang Guan

Researcher at Illinois Institute of Technology

Publications -  29
Citations -  521

Xiaokang Guan is an academic researcher from Illinois Institute of Technology. The author has contributed to research in topics: Electrostatic discharge & Integrated circuit design. The author has an hindex of 11, co-authored 29 publications receiving 488 citations. Previous affiliations of Xiaokang Guan include Freescale Semiconductor & University of California, Riverside.

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Journal ArticleDOI

A review on RF ESD protection design

TL;DR: In this paper, the authors present a review of recent development in RF ESD protection circuit design, including mis-triggering, ESD-induced parasitic effects on RFIC performance, and characterization of RF EDS protection circuits.
Journal ArticleDOI

A mixed-mode ESD protection circuit simulation-design methodology

TL;DR: In this article, a mixed-mode ESD protection simulation-design methodology is presented, which involves multiple-level coupling in EDS protection simulation by solving complex electrothermal equations self-consistently at process, device, and circuit levels in a coupled fashion.
Journal ArticleDOI

Ferrite-Integrated On-Chip Inductors for RF ICs

TL;DR: In this paper, the design and fabrication of on-chip radiofrequency inductors with integrated-ferrite thin Alms is described. But the authors focus on the performance improvement of the inductors over air-cored inductors, e.g., 19%-38% and 17%-28% increase in inductance for Y2.8B0.2Fe5O12 and Co7ZrO9, respectively.
Proceedings ArticleDOI

Mixed-mode ESD protection circuit simulation-design methodology

TL;DR: A new predictive mixed-mode ESD protection simulation-design methodology is presented, which involves multiple-level electro-thermal-process-device-circuit-layout coupling in an E SD protection simulation that solves complex electro-Thermal equations self-consistently at process, device and circuit levels, in a coupled fashion.
Journal ArticleDOI

ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism

TL;DR: A novel smart parametric-checking mechanism and a new intelligent CAD tool, entitled ESD inspector, developed for full-chip ESD-protection circuitry-design verification, are reported.