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Xingchen Pan
Researcher at Chinese Academy of Sciences
Publications - 51
Citations - 367
Xingchen Pan is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Diffraction & Laser. The author has an hindex of 8, co-authored 45 publications receiving 272 citations.
Papers
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Single shot ptychographical iterative engine based on multi-beam illumination
TL;DR: The proposed single shot method omits the needs for a mechanical x-y scanning of standard PIE algorithm and hence dramatically reduces the data acquisition time.
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Single shot multi-wavelength phase retrieval with coherent modulation imaging.
TL;DR: A single shot multi-wavelength phase retrieval method is proposed by combining common coherent modulation imaging (CMI) and a low rank mixed-state algorithm together and can extend its application to various traditionally unrelated fields, where several wavelengths should be considered simultaneously.
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Measurement of the complex transmittance of large optical elements with Ptychographical Iterative Engine
TL;DR: Wavefront control is a significant parameter in inertial confinement fusion (ICF) and can accurately and effectively measure the transmittance of large optical elements with irregular surface profiles, which are otherwise not measurable using commonly used interferometric techniques due to a lack of standard reference plate.
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Wavefront measurement techniques used in high power lasers
TL;DR: The properties of a series of phase measurement techniques, including interferometry, the Hartmann–Shack wavefront sensor, the knife-edge technique, and coherent diffraction imaging, are summarized and their performance in high power laser applications is compared.
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Coherent amplitude modulation imaging based on partially saturated diffraction pattern.
TL;DR: A single-shot phase retrieval algorithm based on a random aperture and partially saturated diffraction pattern is proposed, which has the potential to be adapted for different wavelengths without additional transmission measurement of the wave modulator.