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Zs. Czigany

Researcher at Hungarian Academy of Sciences

Publications -  35
Citations -  907

Zs. Czigany is an academic researcher from Hungarian Academy of Sciences. The author has contributed to research in topics: Sputter deposition & Thin film. The author has an hindex of 17, co-authored 35 publications receiving 813 citations. Previous affiliations of Zs. Czigany include Linköping University.

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Microstructure of α-alumina thin films deposited at low temperatures on chromia template layers

TL;DR: In this paper, radio frequency sputtering has been used to deposit α-alumina (α-Al2O3) thin films at substrate temperatures of 280-560°C.
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Growth of fullerene-like carbon nitride thin solid films by reactive magnetron sputtering; role of low-energy ion irradiation in determining microstructure and mechanical properties

TL;DR: In this article, a dual-magnetron system with coupled magnetic fields was applied to carbon nitride (CNx) carbon-like carbon-nix (CNx) films, where a dc reactive, unbalanced, magnetron sputtering in a N2/Ar mixture from a high-purity pyrolythic graphite cathode was used.
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Tuning the surface morphology in self-organized ion beam nanopatterning of Si(001) via metal incorporation: from holes to dots

TL;DR: The Rutherford backscattering spectrometry measurements show that the surface morphology is tuned by the incorporation of metals coming from the ion source and sample surroundings during the IBS process, resulting in nanohole and nanodot patterns that have promising applications as growth templates for preferential growth on either hillocks or cavities.
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Industrial-scale deposition of highly adherent CNx films on steel substrates

TL;DR: In this article, high- adherent carbon nitride (CNx) films were deposited using a novel pretreatment with two high power impulse magnetron sputtering (HIPIMS) power supplies in a master-slave configuration.
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Columnar growth structure and evolution of wavy interface morphology in amorphous and polycrystalline multilayered thin films

TL;DR: The connection between columnar growth and the evolution of the wavy interface morphology in amorphous and polycrystalline multilayers was investigated by transmission electron microscopy.