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Institution

National Security Agency

GovernmentFort George Meade, Maryland, United States
About: National Security Agency is a government organization based out in Fort George Meade, Maryland, United States. It is known for research contribution in the topics: Signal & Encryption. The organization has 393 authors who have published 485 publications receiving 15916 citations. The organization is also known as: NSA & N.S.A..


Papers
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Journal ArticleDOI
TL;DR: A scalable triangle listing algorithm in the MapReduce model will be presented followed by a description of the experiments with that algorithm that led to the current largest and fastest triangle listing benchmarks to date.
Abstract: The increasing size of Big Data is often heralded but how data are transformed and represented is also profoundly important to knowledge discovery, and this is exemplified in Big Graph analytics. Much attention has been placed on the scale of the input graph but the product of a graph algorithm can be many times larger than the input. This is true for many graph problems, such as listing all triangles in a graph. Enabling scalable graph exploration for Big Graphs requires new approaches to algorithms, architectures, and visual analytics. A brief tutorial is given to aid the argument for thoughtful representation of data in the context of graph analysis. Then a new algebraic method to reduce the arithmetic operations in counting and listing triangles in graphs is introduced. Additionally, a scalable triangle listing algorithm in the MapReduce model will be presented followed by a description of the experiments with that algorithm that led to the current largest and fastest triangle listing benchmarks to date. Finally, a method for identifying triangles in new visual graph exploration technologies is proposed.

21 citations

Journal ArticleDOI
TL;DR: The parity of the number of irreducible factors for any square-free trinomial in F"2[x] was shown in this paper, where n is odd and f(x)=x.

21 citations

Journal ArticleDOI
TL;DR: In this paper, the authors investigated the effects of radiation on MOS devices and showed that agreement in the experimental and theoretical surface to average doses support the use of thermo-luminescent dosimeters (manganese activated calcium fluoride) in specifying the surface dose delivered to thin gate insulators.
Abstract: This paper reports on some investigations of dosimetry, annealing, irradiation sequences, and radioactive sources, involved in the determination of radiation effects on MOS devices. Results show that agreement in the experimental and theoretical surface to average doses support the use of thermo-luminescent dosimeters (manganese activated calcium fluoride) in specifying the surface dose delivered to thin gate insulators of MOS devices. Annealing measurements indicate the existence of at least two energy levels, or activation energies, for recovery of soft oxide MOS devices after irradiation by electrons, protons, and gammas. Damage sensitivities of MOS devices were found to be independent of combinations and sequences of radiation type or energies. Comparison of various gamma sources indicated a small dependence of damage sensitivity on the Cobalt facility, but a more significant dependence in the case of the Cesium source. These results were attributed to differences in the spectral content of the several sources.

20 citations

Journal ArticleDOI
TL;DR: This paper reports on a study of damage equivalence in rad-hard MOS devices with 105 rads (SiO2) capability, which indicated that qualitatively the same charge recombination effects occurred in hard oxide devices for doses of 105 radS as in soft oxide parts for dosesof 1 to 4 krads.
Abstract: This paper reports on a study of damage equivalence in rad-hard MOS devices with 105 rads (SiO2) capability. Damage sensitivities for electrons of 1, 2, 3, 5, and 7 MeV, protons of 1, 3, 7, 22, and 40 MeV, 3.4-MeV alphas, and Co-60 gammas were measured and compared. Results indicated that qualitatively the same charge recombination effects occurred in hard oxide devices for doses of 105 rads (SiO2) as in soft oxide parts for doses of 1 to 4 krads (SiO2). Consequently, damage equivalency or non-equivalency depended on radiation type and energy. However, recovery effects, both during and after irradiation, controlled relative damage sensitivity and its dependency on total dose, dose rate, supply bias, gate bias, radiation type, and energy. Correction factors can be derived from these data or from similar tests of other hard oxide types, so as to properly evaluate the combined effects of the total space environment.

20 citations

Journal ArticleDOI
TL;DR: A workshop on privacy and protection in operating systems in Princeton, New Jersey, from June 12-14, 1972 was sponsored by the IEEE Committee on Operating Systems.
Abstract: The IEEE Committee on Operating Systems sponsored a workshop on privacy and protection in operating systems in Princeton, New Jersey, from June 12-14, 1972. Thirty-two people interested in operating system protection met at the Nassau Inn to discuss various problems and their possible solutions. The workshop was organized by Dr. R. Stockton Gaines of the Institute for Defense Analysis, Princeton. He and Professor Peter Denning, Princeton University, acted as session chairmen.

20 citations


Authors

Showing all 394 results

NameH-indexPapersCitations
Robert L. Grossman5232015551
Dianne P. O'Leary4422311469
Keith Schwab37917617
Chris A. Mack312314592
Young H. Kwark281233133
Christopher J. K. Richardson231221535
Akin Akturk191021272
Julius Goldhar19921218
Kevin Osborn19652153
Patrick W. Dowd18611437
Kevin Borders17261314
David G. Harris171021055
R. W. R. Darling16541762
Gail Letzter1532986
Benjamin Palmer1537659
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20222
20218
202014
201914
20184
20178