Showing papers in "Microelectronics Reliability in 1974"

TL;DR: In this article, an accelerated test using the vapour pressure of water is supported by experimental observations and provides the basis for a simple, short-term test for assessing the reliability of plastic encapsulated semiconductor devices intended for long-life applications.

TL;DR: In this paper, various problems associated with conducting and evaluating electromigration tests in order to obtain valid lifetime information about actual devices are examined and means for surmounting such problems are suggested.

TL;DR: In this article, four stochastic failure models are proposed and their characteristics are discussed and the distribution of the total amount of damage at time t, (i) the mean total amount, (ii) the time to failure of an item, and (iii) the failure rate.

TL;DR: In this paper, a standby redundant system of two dissimilar units is considered under the assumptions that both the failure and the repair time distributions are arbitrary, and the system states are defined corresponding to the failure of the specified units.

TL;DR: In this paper, the reliability optimization is secured through a simple random search process useful for a large system, where an initial point is chosen where all substages have the same reliability and the random search begins about this point.

TL;DR: In this article, the properties of various screen material for printing thick film inks and pastes required to delineate thick film integrated circuits are compared, and the advantages and disadvantages of using any type of fabric are also discussed.

TL;DR: In this article, a complex system comprised of two types of components (I and II) has been considered, and the operational behaviour of such a system has been investigated under preemptive resume repair discipline using supplementary variable technique and Laplace Transforms.

TL;DR: Both reliability and availability can be considered as design criteria to arrive at an optimum configuration, in order to achieve an optimum reliability design of a system.

TL;DR: In this paper, the authors consider the use of redundant memories for the ultra-reliable control of a system and present a review of the literature on both approaches to the mechanization problem and an extensive bibliography is provided.

TL;DR: In this article, a multi-point probe and automatic electronic visual display technique are introduced that will yield statistical results which are necessary for the investigation of temperature, electric field, thermal annealing, and radiation effects in the breakdown characteristics, and an interpretation of the physical mechanisms involved.

TL;DR: The fundamental principles and techniques employed in the analysis of complex reliability block diagrams are described, together with a systematic method of translating reliabilityBlock diagrams into probability state diagrams.

TL;DR: Based on step-stress testing and cumulative damage, an Eyring model has been suitably modified for different test conditions as mentioned in this paper, and the modified models have been put on sound theoretical footings and experimental verification has been obtained when temperature is constant.

TL;DR: This paper discusses the latter approach of the software reliability approach and deals with such important problems as reliability prediction and designing.

TL;DR: In this paper, the first time that the total amount of off time exceeds a specified time was derived for a modified alternating renewal process, which can be described as an alternating renewal.

TL;DR: In this article, the authors describe the environment in which these instruments are expected to perform, and attempt to identify the more common mechanisms of failure, and some practical suggestions are offered, concerning equipment design, which have proved to be beneficial in reducing the incidence of malfunction.

TL;DR: In this paper, the life test stability and failure mechanism of RuO 2-based thick film resistors at elevated temperature and high humidity have been examined, and it was found that the change of resistance under high humidity conditions is caused mainly by reaction ofRuO 2 + x H 2 O → RuO O 2 : x H O 2 O, and that the resistance value of the resistors have little resistance drift and are stable.

TL;DR: A variation of the redundancy optimization problem of reliability has been considered here and the solution has been obtained by pseudo-Boolean programming also.

TL;DR: In this article, the moments of a nonnegative continuous random variable, expressed directly in terms of the associated hazard function, are derived for three applications where the hazard function constitutes the primary information.

TL;DR: In this paper, the relationship between Markov renewal processes and signal-flow graphs has been studied and extended to the renewal functions and the transition probabilities illustrating a two-unit standby redundant model in reliability theory.

TL;DR: The problem areas while using the state space approach for large and complex repairable systems are identified and suitable methods for overcoming these difficulties are suggested.

TL;DR: The flow graph method of reliability evaluation has been extended to consider simultaneously the node as well as link failure, which leads to a simpler reliability expression.

TL;DR: In this article, bipolar SSI digital ICs of the TTL, DTL and RTL series have been considered comprising about 60 million device-hr, life-tested by various long run stress methods as temperature storage, d.c., and switching-service operational tests to gain a fair picture on main failure mechanisms, the nature and shift tendencies of parameter distributions as well as on the activation energy of degradation processes.

TL;DR: In this paper, the authors expose les principes de la gravure ionique and analyse les effects des differents parametres of ce procede sur les resultats obtenus.

TL;DR: In this article, the authors considered the case of two dissimilar unit redundant systems with Erlang-failure and general repair distributions and derived the Laplace transforms of the reliability and the explicit formula for the mean time to system failure.

TL;DR: In this article, the additional event method (or method of collective marks) is used to derive the joint distribution of time to nonavailability and number of served customers for a reliability system undergoing failure and repair.

TL;DR: Bayesian analysis of a k-variate normal distribution model as used in life testing context is considered with respect to the estimation problem of the reliability function of a system in this article, and it is pointed out that there exists a close relationship between the problem of estimation of reliability, and that of construction of Bayesian upper 100 η% tolerance regions