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Showing papers in "Soldering & Surface Mount Technology in 2019"


Journal ArticleDOI
TL;DR: In this paper, a numerical model of 3-dimensional integrated circuits (3-D ICs) was established and the Taguchi experiment was designed to simulate the influence of IMC joint material, solder joint array and package size.
Abstract: The transistor circuit based on Moore's Law is approaching the performance limit. The three-dimensional integrated circuit (3-D IC) is an important way to implement More than Moore. The main problems in the development of 3-D IC are Joule heating and stress. The stresses and strains generated in 3-D ICs will affect the performance of electronic products, leading to various reliability issues. The intermetallic compound (IMC) joint materials and structures are the main factors affecting 3-D IC stress. The purpose of this paper is to optimize the design of the 3-D IC.,To optimize the design of 3-D IC, the numerical model of 3-D IC was established. The Taguchi experiment was designed to simulate the influence of IMC joint material, solder joint array and package size on 3-D IC stress.,The simulation results show that the solder joint array and IMC joint materials have great influence on the equivalent stress. Compared with the original design, the von Mises stress of the optimal design was reduced by 69.96 per cent, the signal-to-noise ratio (S/N) was increased by 10.46 dB and the fatigue life of the Sn-3.9Ag-0.6Cu solder joint was increased from 415 to 533 cycles, indicating that the reliability of the 3-D IC has been significantly improved.,It is necessary to study the material properties of the bonded structure since 3-D IC is a new packaging structure. Currently, there is no relevant research on the optimization design of solder joint array in 3-D IC. Therefore, the IMC joint material, the solder joint array, the chip thickness and the substrate thickness are selected as the control factors to analyze the influence of various factors on the 3-D IC stress and design. The orthogonal experiment is used to optimize the structure of the 3-D IC.

23 citations


Journal ArticleDOI
TL;DR: In this paper, the shear strength and fracture mechanism of full Cu-sn IMCs joints with different Cu3Sn proportion and joints with the conventional interfacial structure in electronic packaging were analyzed.
Abstract: Purpose This study aims to analyze the shear strength and fracture mechanism of full Cu-Sn IMCs joints with different Cu3Sn proportion and joints with the conventional interfacial structure in electronic packaging. Design/methodology/approach The Cu-Sn IMCs joints with different Cu3Sn proportion were fabricated through soldering Cu-6 μm Sn-Cu sandwich structure under the extended soldering time and suitable pressure. The joints of conventional interfacial structure were fabricated through soldering Cu-100 μm Sn-Cu sandwich structure. After the shear test was conducted, the fracture mechanism of different joints was studied through observing the cross-sectional fracture morphology and top-view fracture morphology of sheared joints. Findings The strength of joints with the conventional interfacial structure was 26.6 MPa, while the strength of full Cu-Sn IMCs joints with 46.7, 60.6, 76.7 and 100 per cent Cu3Sn was, respectively, 33.5, 39.7, 45.7 and 57.9 MPa. The detailed reason for the strength of joints showing such regularity was proposed. For the joint of conventional interfacial structure, the microvoids accumulation fracture happened within the Sn solder. However, for the full Cu-Sn IMCs joint with 46.7 per cent Cu3Sn, the cleavage fracture happened within the Cu6Sn5. As the Cu3Sn proportion increased to 60.6 per cent, the inter-granular fracture, which resulted in the interfacial delamination of Cu3Sn and Cu6Sn5, occurred along the Cu3Sn/Cu6Sn5 interface, while the cleavage fracture happened within the Cu6Sn5. Then, with the Cu3Sn proportion increasing to 76.7 per cent, the cleavage fracture happened within the Cu6Sn5, while the transgranular fracture happened within the Cu3Sn. The inter-granular fracture, which led to the interfacial delamination of Cu3Sn and Cu, happened along the Cu/Cu3Sn interface. For the full Cu3Sn joint, the cleavage fracture happened within the Cu3Sn. Originality/value The shear strength and fracture mechanism of full Cu-Sn IMCs joints was systematically studied. A direct comparison regarding the shear strength and fracture mechanism between the full Cu-Sn IMCs joints and joints with the conventional interfacial structure was conducted.

21 citations


Journal ArticleDOI
TL;DR: In this article, the authors reviewed and examined three of the most common corrosion characterization techniques specifically on Sn-Zn solders, namely potentiostatic polarization, potentiodynamic polarization, and electrochemical impedance spectroscopy (EIS).
Abstract: The purpose of this paper is to review and examine three of the most common corrosion characterization techniques specifically on Sn-Zn solders. The discussion will highlight the configurations and recent developments on each of the compiled characterization techniques of potentiodynamic polarization, potentiostatic polarization and electrochemical impedance spectroscopy (EIS).,The approach will incorporate a literature review of previous works related to the experimental setups and common parameters.,The potentiostatic polarization, potentiodynamic polarization and EIS were found to provide crucial and vital information on the corrosion properties of Sn-Zn solders. Accordingly, this solder relies heavily on the amount of Zn available because of the inability to produce the intermetallic compound in between the elements. Further, the excellent mechanical properties and low melting temperature of the Sn-Zn solder is undeniable, however, the limitations regarding corrosion resistance present opportunities in furthering research in this field to identify improvements. This is to ensure that the corrosion performance can be aligned with the outstanding mechanical properties. The review also identified and summarized the advantages, recent trends and important findings in this field.,The unique challenges and future research directions regarding corrosion measurement in Sn-Zn solders were shown to highlight the rarely discussed risks and problems in the reliability of lead-free soldering. Many prior reviews have been undertaken of the Sn-Zn system, but limited studies have investigated the corrosive properties. Therefore, this review focuses on the corrosive characterizations of the Sn-Zn alloy system.

19 citations


Journal ArticleDOI
TL;DR: In this article, the authors investigate measurement and regulation of saturated vapour height level in vapour phase soldering (VPS) chamber based on parallel plate capacitor and retaining a stable saturated vapours level above the boiling fluid, regardless of the quantity and size of assembled components.
Abstract: Purpose The purpose of this paper is to investigate measurement and regulation of saturated vapour height level in vapour phase soldering (VPS) chamber based on parallel plate capacitor and retaining a stable saturated vapour level above the boiling fluid, regardless of the quantity and size of assembled components. Design/methodology/approach Development and realisation of capacitance sensor that sensitively senses the maximum height level of saturated vapour above the boiling fluid in the VPS chamber was achieved. Methodology of measurement is based on capacitor change from single air to a parallel plate, filled with two dielectric environments in a stacked configuration: condensed fluid and vapour (air). Findings An easy air plate capacitor immersed in the saturated vapour above the boiling fluid can serve as a parallel plate capacitor owing to the conversion of the air to the parallel plate capacitor. A thin film of fluid between the two capacitor plates corresponds to the height of the saturated vapour, which changes the capacity of the parallel plate capacitor. Originality/value Introducing the capacitive sensor directly into the VPS work space allows to achieve a constant height level of saturated vapour. Based on the capacity change, it is possible to control the heating power. There is a lack of information regarding measurement of stable height of vapour in the industry, and the present article shows how to easily improve the way to regulate the bandwidth of saturated vapour in the VPS process.

19 citations


Journal ArticleDOI
TL;DR: In this article, the effect of a blast wave on the microstructure, intermetallic layers and hardness properties of Sn0.3Ag0.7Cu (SAC0307) lead-free solder was discussed.
Abstract: The purpose of this paper is to discuss the effect of a blast wave on the microstructure, intermetallic layers and hardness properties of Sn0.3Ag0.7Cu (SAC0307) lead-free solder.,Soldered samples were exposed to the blast wave by using trinitrotoluene (TNT) explosive. Microstructure and intermetallic layer thickness were identified using Alicona ® Infinite Focus Measurement software. Hardness properties of investigated solders were determined using a nanoindentation approach.,Microstructure and intermetallic layers changed under blast wave condition. Hardness properties of exposed solders decreased with an increase in the TNT explosive weight.,Microstructural evolution and mechanical properties of the exposed solder to the blast wave provide a fundamental understanding on how blast waves can affect the reliability of a solder joint, especially for military applications.

18 citations


Journal ArticleDOI
TL;DR: A machine learning framework for predicting the life of solder joints accurately has been developed and it is applied to predict the long-term reliability of lead-free Sn96.5Ag3.0Cu0.5 (SAC305) for three commonly used surface finishes.
Abstract: This paper aims to present a machine learning framework for using big data analytics to predict the reliability of solder joints. The purpose of this study is to accurately predict the reliability of solder joints by using big data analytics.,A machine learning framework for using big data analytics is proposed to predict the reliability of solder joints accurately.,A machine learning framework for predicting the life of solder joints accurately has been developed in this study. To validate its accuracy and efficiency, it is applied to predict the long-term reliability of lead-free Sn96.5Ag3.0Cu0.5 (SAC305) for three commonly used surface finishes such OSP, ENIG and IAg. The obtained results show that the predicted failure based on the machine learning method is much more accurate than the Weibull method. In addition, solder ball/bump joint failure modes are identified based on various solder joint failures reported in the literature.,The ability to predict thermal fatigue life accurately is extremely valuable to the industry because it saves time and cost for product development and optimization.

18 citations


Journal ArticleDOI
TL;DR: In this paper, the structural, mechanical, thermal and electrical properties of tin-silver-nickel (Sn-Ag-Ni) melt-spun solder alloys were investigated using x-ray diffractions, scanning electron microscope, dynamic resonance technique (DRT), Instron machine, Vickers hardness tester and differential scanning calorimetry.
Abstract: This study aims to investigate the structural, mechanical, thermal and electrical properties of tin–silver–nickel (Sn-Ag-Ni) melt-spun solder alloys. So, it aims to improve the mechanical properties of the eutectic tin–silver (Sn-Ag) such as tensile strength, plasticity and creep resistance by adding different concentrations of Ni content.,Ternary melt-spun Sn-Ag-Ni alloys were investigated using x-ray diffractions, scanning electron microscope, dynamic resonance technique (DRT), Instron machine, Vickers hardness tester and differential scanning calorimetry.,The results revealed that the Ni additions 0.1, 0.3, 0.5, 0.7, 1, 3 and 5 Wt.% to the eutectic Sn-Ag melt-spun solder were added. The “0.3wt.%” of Ni was significantly improved its mechanical properties to efficiently serve under high strain rate applications. Moreover, the uniform distribution of Ag3Sn intermetallic compound with “0.3wt.%” of Ni offered the potential benefits, such as high strength, good plasticity consequently and good mechanical performance through a lack of dislocations and microvoids. The tensile results showed improvement in 17.63 per cent tensile strength (26 MPa), 21 per cent toughness (1001 J/m3), 22.83 per cent critical shear stress (25.074 MPa) and 11 per cent thermal diffusivity (2.065 × 10−7 m2/s) when compared with the tensile strength (21.416 MPa), toughness (790 J/m3), critical shear stress (19.348 MPa) and thermal diffusivity (1.487 × 10−7 m2/s) of the eutectic Sn-Ag. Slight increments have been shown for the melting temperature of Sn96.2-Ag3.5-Ni0.3 (222.62°C) and electrical resistivity to (1.612 × 10−7 Ω.m). It can be said that the eutectic Sn-Ag solder alloy has been mechanically improved with “0.3wt.%” of Ni to become a suitable alloy for high strain rate applications. The dislocation movement deformation mechanism (n = 4.5) without Ni additions changed to grain boundary sliding deformation mechanism (n = 3.5) with Ni additions. On the other hand, the elastic modulus, creep rate and strain rate sensitivity with “0.3wt.%” of Ni have been decreased. The optimum Ni-doped concentration is “0.7wt.%” of Ni in terms of refined microstructure, electrical resistivity, Young’s Modulus, bulk modulus, shear modulus, thermal diffusivity, maximum shear stress, tensile strength and average creep rate.,This study provides nickel effects on the structural of the eutectic Sn-Ag rapidly solidified by melt-spinning technique. In this paper, the authors have compared the elastic modulus of the melt-spun compositions which has been resulted from the tensile strength tester with these results from the DRT for the first time to best of the authors’ knowledge. This paper presents new improvements in mechanical and electrical performance.

17 citations


Journal ArticleDOI
TL;DR: A comprehensive review of the tin-silver-copper solder series with possible solutions for improving their microstructure, melting point, mechanical properties and wettability through the addition of different elements/nanoparticles and other materials is presented in this paper.
Abstract: Purpose The research on lead-free solder alloys has increased in past decades due to awareness of the environmental impact of lead contents in soldering alloys. This has led to the introduction and development of different grades of lead-free solder alloys in the global market. Tin-silver-copper is a lead-free alloy which has been acknowledged by different consortia as a good alternative to conventional tin-lead alloy. The purpose of this paper is to provide comprehensive knowledge about the tin-silver-copper series. Design/methodology/approach The approach of this study reviews the microstructure and some other properties of tin-silver-copper series after the addition of indium, titanium, iron, zinc, zirconium, bismuth, nickel, antimony, gallium, aluminium, cerium, lanthanum, yttrium, erbium, praseodymium, neodymium, ytterbium, nanoparticles of nickel, cobalt, silicon carbide, aluminium oxide, zinc oxide, titanium dioxide, cerium oxide, zirconium oxide and titanium diboride, as well as carbon nanotubes, nickel-coated carbon nanotubes, single-walled carbon nanotubes and graphene-nano-sheets. Findings The current paper presents a comprehensive review of the tin-silver-copper solder series with possible solutions for improving their microstructure, melting point, mechanical properties and wettability through the addition of different elements/nanoparticles and other materials. Originality/value This paper summarises the useful findings of the tin-silver-copper series comprehensively. This information will assist in future work for the design and development of novel lead-free solder alloys.

16 citations


Journal ArticleDOI
TL;DR: In this paper, the effect of lanthanum doping on the microstructure, microhardness and tensile properties of Tin-Silver-Copper as a function of thermal aging time for 60, 120 and 180'h at a high temperature of 150°C and at high strain rates of 25, 35 and 45's.
Abstract: Tin-Silver-Copper is widely accepted as the best alternative to replace Tin-Lead solders in microelectronics packaging due to their acceptable properties. However, to overcome some of the shortcomings related to its microstructure and in turn, its mechanical properties at high temperature, the addition of different elements into Tin-Silver-Copper is important for investigations. The purpose of this paper is to analyse the effect of lanthanum doping on the microstructure, microhardness and tensile properties of Tin-Silver-Copper as a function of thermal aging time for 60, 120 and 180 h at a high temperature of 150°C and at high strain rates of 25, 35 and 45/s.,The microstructure of un-doped and Lanthanum-doped Tin-Silver-Copper after different thermal aging time is examined using scanning electron microscopy followed by digital image analyses using ImageJ. Brinell hardness is used to find out the microhardness properties. The tensile tests are performed using the universal testing machine. All the investigations are done after the above selected thermal aging time at high temperature. The tensile tests of the thermally aged specimens are further investigated at high strain rates of 25, 35 and 45/s.,According to the microstructural examination, Tin-Silver-Copper with 0.4 Wt.% Lanthanum is found to be more sensitive at high temperature as the aging time increases which resulted in coarse microstructure due to the non-uniform distribution of intermetallic compounds. Similarly, lower values of microhardness, yield strength and ultimate tensile strength come in favours of 0.4 Wt.% Lanthanum added Tin-Silver-Copper. Furthermore, when the thermally aged tensile specimen is tested at high strains, two trends in tensile curves of both the solder alloys are noted. The trends showed that yield strength and ultimate tensile strength increase as the strain rate increase and decrease when there is an increase in thermal aging.,The addition of higher supplement (0.4 Wt.%) of Lanthanum into Tin-Silver-Copper showed a lower hardness value, yield strength, ultimate tensile strength, ductility, toughness and fatigue in comparison to un-doped Tin-Silver-Copper at high temperature and at high strain rates. Finally, simplified material property models with minimum error are developed which will help when the actual test data are not available.

16 citations


Journal ArticleDOI
TL;DR: In this paper, an experimental approach was used to explore process parameter and printing defects during the surface mount assembly (SMA) process, and an optimized line was proposed that minimized the printing defects.
Abstract: The purpose of this paper is to investigate and minimize the printing-related defects in the surface mount assembly (SMA) process.,This paper uses an experimental approach to explore process parameter and printing defects during the SMA process. Increasing printing performance, various practices of solder paste (Ag3.0/Cu0.5/Sn) storage and handling are suggested. Lopsided paste problem is studied by varying squeegee pressure and the results are presented. Unfilled pads problems are observed for ball grid array (BGA) and quad flat package (QFP) which is mitigated by proper force tuning. In this paper, a comparative study is conducted which evaluates the manifestation of printing offset due to low-grade stencil. The input/output (I/O) boards were oxidized when the relative humidity was maintained beyond 70 per cent for more than 8 h. This pad oxidation problem is overcome by proper printed circuit board (PCB) handling procedures. When the unoptimized line is used, the paste wedged in the stencil and influences the performance of the screen printer, for this reason, an optimized line is proposed that minimize the printing defects.,The key findings are as follows: in the SMA process, printing quality is directly associated with solder paste quality. Experimentally, it is observed that a considerable variance in solder deposition occurred when the front and rear squeegee have different configurations. High-grade and unsoiled stencil results in superior paste deposition and less distinction. Insufficient solder paste and bridge problems also occur in printing when PCB pads are oxidized. Optimized line resolves solder paste clog issues, associated with stencil’s aperture. The cooling arrangement on the conveyor, after reflow, explicates hot jig problem. Control environmental conditions minimized static charges and printing defects.,The preceding studies emphasis mostly on the squeegee pressure, while other important parameters are not completely investigated. Moreover, it is very imperative to concurrently measure all parameters while varying the environmental conditions. This study highlights and provides an experimental approach to various PCB printing defects, and a comparative study has been conducted that concurrently measure all process parameters.

14 citations


Journal ArticleDOI
TL;DR: In this paper, the reliability performance of land grid array and ball grid array solders, as well as the SAC105 and 63Sn37Pb solder alloys, in vibration loading conditions was investigated and compared.
Abstract: Purpose This paper aims to investigate and compare the reliability performance of land grid array (LGA) and ball grid array (BGA) solders, as well as the SAC105 and 63Sn37Pb solder alloys, in vibration loading conditions. Design/methodology/approach Reliability tests were conducted using a sine dwell with resonance tracking vibration experiment. Finite element simulations were performed to help in understanding the observed failure trends. Findings Reliability results showed that the tin-lead solders out-perform lead-free solders in vibrations loading. Additionally, the LGA solder type could provide a better vibration reliability performance than BGA solders. Failure analysis results showed that in LGAs, the crack is initiated at the printed circuit board side and at the component side in BGAs. In both types, the crack is propagated throughout in the intermetallic compound layer. Originality/value In literature, there is a lack of published data in the comparison between LGA and BGA reliability performance in vibration loadings. This paper provides useful insights in the vibration reliability behavior of the two common solder joint types.

Journal ArticleDOI
TL;DR: In this article, the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package were investigated using a focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) and nanoindenter.
Abstract: Purpose This study aims to investigate the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package. Design/methodology/approach Lead-free Sn-Ag-Cu (SAC) solder paste was mixed with various percentages of NiO nanoparticles to prepare the new form of nano-reinforced solder paste. The solder paste was applied to assemble the ultra-fine capacitor using the reflow soldering process. A focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) was used in this study. In addition, X-ray inspection system, field emission scanning electron microscopy coupled with EDS, X-ray photoelectron spectroscopy (XPS) and nanoindenter were used to analyse the solder void, microstructure, hardness and fillet height of the solder joint. Findings The experimental results revealed that the highest fillet height was obtained with the content of 0.01 Wt.% of nano-reinforced NiO, which fulfilled the reliability requirements of the international IPC standard. However, the presence of the NiO in the lead-free solder paste only slightly influenced the changes of the intermetallic layer with the increment of weighted percentage. Moreover, the simulation method was applied to observe the distribution of NiO nanoparticles in the solder joint. Originality/value The findings are expected to provide a profound understanding of nano-reinforced solder joint’s characteristics of the ultra-fine package.

Journal ArticleDOI
TL;DR: In this article, a new indicative parameter of filling efficiency was introduced to quantify the performance and productivity of the flip-chip underfill encapsulation process, and the effect of bump pitch on filling efficiency were studied based on the past actual-scaled and current scaled-up underfill experiments.
Abstract: This paper aims to introduce a new indicative parameter of filling efficiency to quantify the performance and productivity of the flip-chip underfill encapsulation process. Additionally, the variation effect of the bump pitch of flip-chip on the filling efficiency was demonstrated to provide insight for flip-chip design optimization.,The filling efficiency was formulated analytically based on the conceptual spatial and temporal perspectives. Subsequently, the effect of bump pitch on filling efficiency was studied based on the past actual-scaled and current scaled-up underfill experiments. The latter scaled-up experiment was validated with both the finite volume method-based numerical simulation and analytical filling time model. Moreover, the scaling validity of scaled-up experiment was justified based on the similarity analysis of dimensionless number.,Through the scaling analysis, the current scaled-up experimental system is justified to be valid since the adopted scaling factor 40 is less than the theoretical scaling limit of 270. Furthermore, the current experiment was qualitatively well validated with the numerical simulation and analytical filling time model. It is found that the filling efficiency increases with the bump pitch, such that doubling the bump pitch would triple the efficiency.,The new performance indicative index of filling efficiency enables the package designers to justify the variation effect of underfill parameter on the overall underfill process. Moreover, the upper limit of scaling factor for scaled-up package was derived to serve as the guideline for future scaled-up underfill experiments.,The performance of underfill process as highlighted in this paper was never being quantified before in the past literatures. Similarly, the scaling limit that is associated to the scaled-up underfill experiment was never being reported elsewhere too.

Journal ArticleDOI
TL;DR: In this article, a bi-manual virtual multi-modal training interface for learning basic skills in surface mount device hand soldering is proposed, which can help unskilled people find educational opportunities and job offers in the electronics industry.
Abstract: Purpose Offering unskilled people training in engineering and vocational skills helps to decrease unemployment rate. The purpose of this paper is to augment actual hands-on conventional vocational training methods with virtual haptic simulations as part of computer-based vocational education and training. Design/methodology/approach This paper discusses the design of a bi-manual virtual multi-modal training interface for learning basic skills in surface mount device hand soldering. This research aims to analyze human hand dexterity of novices and experts at micro level skill knowledge capture by simulating and tracking the users’ actions in the manual soldering process through a multi-modal user interface. Findings Haptic feedback can enhance the experience of a virtual training environment for the end user and can provide a supplementary modality for imparting tangible principles to increase effectiveness. This will improve the teaching and learning of engineering and vocational skills with touch-based haptics technology, targeted toward teachers and students of various disciplines in engineering. Compared with the traditional training methods for learning soldering skills, the proposed method shows more efficiency in faster skill acquisition and skill learning. Originality/value In this study, the authors proposed a novel bi-manual virtual training simulator model for teaching soldering skills for surface mount technology and inspection. This research aims to investigate the acquisition of soldering skills through virtual environment, with and without haptic feedback. This acts as a basic-level training simulator that provides introductory training in soldering skills and can help initially unskilled people find educational opportunities and job offers in the electronics industry.

Journal ArticleDOI
TL;DR: In this paper, the authors investigated the decomposition behavior of binary mixtures of organic activators commonly used in the no-clean wave flux systems upon their exposure to thermal treatments simulating wave soldering temperatures.
Abstract: The purpose of this paper is to investigate the decomposition behavior of binary mixtures of organic activators commonly used in the no-clean wave flux systems upon their exposure to thermal treatments simulating wave soldering temperatures. The binary blends of activators were studied at varying ratios between the components.,Differential scanning calorimetry and thermogravimetric analysis were used to study the characteristics of weak organic acid (WOA) mixtures degradation as a function of temperature. The amount of residue left on the surface after the heat treatments was estimated by gravimetric measurements as a function of binary mixture type, temperature and exposure time. Ion chromatography analysis was used for understanding the relative difference between decomposition of activators in binary blends. The aggressivity of the left residue was assessed using the acidity indication gel test, and effect on reliability was investigated by DC leakage current measurement performed under varying humidity and potential bias conditions.,The results show that the typical range of temperatures experienced by electronics during the wave soldering process is not sufficient for the removal of significant activator amounts. If the residues contain binary mixture of WOAs, the final ratio between the components, the residue level and the corrosive effects depend on the relative decomposition behavior of individual components. Among the WOA investigated under the conventional wave soldering temperature, the evaporation and removal of succinic acid is more dominant compared to adipic and glutaric acids.,The findings are attributed to the chemistry of WOAs typically used as flux activators for wave soldering purposes. The results show the importance of controlling the WOA content and ratio between activating components in a flux formulation in relation to its tendencies for evaporation during soldering and the impact of its residues on electronics reliability.,The results show that the significant levels of flux residues can only be removed at significantly higher temperatures and longer exposure times compared to the conventional temperature range used for the wave soldering process. The potential corrosion issues related to insufficient flux residues removal will be determined by the residue amount, its composition and ratio between organic components. The proper time of thermal treatment and careful choice of fluxing formulation could ensure more climatically reliable product.

Journal ArticleDOI
TL;DR: In this article, an active type Sn-Ag-Ti solder was used to solder AlN ceramics with a Cu substrate using power ultrasound, and the fluxless soldering method was applied.
Abstract: This study aims to solder AlN ceramics with a Cu substrate using an active type Sn-Ag-Ti solder. Soldering was performed with power ultrasound. The Sn3.5Ag2Ti alloy was first studied.,It was found to contain a Sn matrix, where both Ag phase – ɛ-Ag3Sn – and Ti phases ɛ-Ti6Sn5 and Ti2Sn3 – were identified. Ti contained in these phases is distributed to the interface with ceramic material. A reaction layer was thus formed. This layer varies in thickness from 0.5 to 3.5 µm and ensures the wettability of an active solder on the surfaces of ceramic materials.,X-ray diffraction analysis proved the presence of new NTi and AlTi2 phases on the fractured surface. Sn plays the main role in bond formation when soldering the Cu substrate with Sn-Ag-Ti solder. The Cu3Sn and Cu6Sn5 phases, which grow in direction from the phase interface to solder matrix, were found in all cases within the solder/Cu substrate interface. The combination of AlN ceramics/Cu joint maintained a shear strength of 29.5 MPa, whereas the Cu/Cu joint showed a somewhat higher shear strength of 39.5 MPa.,The present study was oriented towards soldering of AlN ceramics with a Cu substrate by the aid of ultrasound, and the fluxless soldering method was applied. Soldering alloy type Sn-Ag-Ti was analysed, and the interactions between the solder and ceramic and/or Cu substrate were studied. The shear strength of fabricated soldered joints was measured.

Journal ArticleDOI
TL;DR: In this paper, the effects of thermal shock on the mechanical property and fracture behavior of Sn-37Pb solder bumps were discussed, and the impact shear test for the single solder bump is more convenient and economical and is actively pursued by the industries.
Abstract: With continuous concerning on the toxic of element Pb, Pb-free solder was gradually used to replace traditional Sn-Pb solder. However, during the transition period from Sn-Pb to Pb-free solder, mixing of Sn-Pb and Pb-free is inevitable occurred in certain products, and in China where Sn-Pb solder was still used extensively in certain areas especially. Correspondingly, understanding reliability of Sn-Pb solder joints was very important, and further studies were needed.,Thermal shock test between −55°C and 125 °C was conducted on Sn-37Pb solder bumps in the BGA package to investigate the microstructure evolution and the growth mechanism of interfacial intermetallic compound (IMC) layer. The effects of thermal shock on the mechanical property and fracture behavior of Sn-37Pb solder bumps were discussed.,Pb-rich phase was coarsened and voids were increased at first; Pb-rich phase was refined and voids were decreased secondly with the increase of thermal shock cycles; the shear strength of solder bumps was slightly decreased after thermal shock, but was back up to 73.67MPa at 2,000 cycles; interfacial IMCs of solder bumps was from typical scallop-type into smooth, the composition of IMCs was from Cu6Sn5 into Cu6Sn5 and Cu3Sn after thermal shock with 1,500 and 2,000 cycles; 20.0 per cent of solder bumps at 1,500 cycles and 9.5 per cent of solder bumps at 2,000 cycles were failure respectively.,Compared with the board level test method, the impact shear test for the single solder bump is more convenient and economical and is actively pursued by the industries. The shear strength of solder bumps was slightly decreased after thermal shock, but was back up to 73.67 MPa at 2,000 cycles; 20.0 per cent of solder bumps at 1,500 cycles and 9.5 per cent of solder bumps at 2,000 cycles were failure.

Journal ArticleDOI
TL;DR: In this article, the effect of chromium (Cr) on the microstructural, mechanical and thermal properties of melt-spun Sn-3.5Ag alloy was investigated using X-ray diffraction, scanning electron microscope, dynamic resonance technique, instron machine, Vickers hardness tester and differential scanning calorimetry.
Abstract: This study aims to investigate the chromium (Cr) effects on the microstructural, mechanical and thermal properties of melt-spun Sn-3.5Ag alloy.,Ternary melt-spun Sn-Ag-Cr alloys were investigated using X-ray diffractions, scanning electron microscope, dynamic resonance technique, instron machine, Vickers hardness tester and differential scanning calorimetry.,The results revealed that the Ag3Sn intermetallic compound (IMC) and s-Sn have been refined because of the hard inclusions’ (Cr atoms) effects, causing lattice distortion increasing these alloys. The tensile results of Sn96.4-Ag3.5-Cr0.1 alloy showed an improvement in Young’s modulus more than 100 per cent (42.16 GPa), ultimate tensile strength (UTS) by 9.4 per cent (23.9 MPa), compared with the eutectic Sn-Ag alloy due to the high concentration of Ag3Sn and their uniform distribution. Shortage in the internal friction (Q−1) of about 54 per cent (45.1) and increase in Vickers hardness of about 7.4 per cent (142.1 MPa) were also noted. Hexagonal Ag3Sn formation led to low toughness values compared to the eutectic Sn-Ag alloy, which may have resulted from the mismatching among hexagonal Ag3Sn phase with orthorhombic Ag3Sn and s-Sn phases. Mechanically, the values of Young’s modulus have been increased, with increasing chromium content, whereas the UTS and toughness values have been decreased. The opposite of this trend appeared in Sn95.8-Ag3.5-Cr0.7 alloy, which may have been due to high lattice distortion (ƹ = 16.5 × 10−4) compared to the other alloys. Increase in the melting temperature Tm, ΔH, Cp and ΔT was because of Ag3Sn IMC formation. The low toughness of Sn96-Ag3.5-Cr0.5 and Sn95.8-Ag3.5-Cr0.7 (109.56 J/m3 and 35.66 J/m3), relatively high melting temperature Tm (223.22°C and 222.65°C) and low thermal conductivity and thermal diffusivity (32.651 w.m−1.k−1 and 0.314 m2/s) make them undesirable in the soldering process. The high UTS, high E, high thermal conductivity and diffusivity, low creep rate and low electrical resistivity, which have occurred with “0.1 Wt.%” of Cr, make this alloy desirable and reliable for soldering applications and electronic assembly.,This study provides chromium effects on the structure of the eutectic Sn-Ag rapidly solidified by melt-spinning technique. In this paper, the authors compared the elastic modulus of the melt-spun compositions, which have been resulted from the Static method with that have been resulted from the Dynamic method. This paper presents new improvements in mechanical and thermal performance.

Journal ArticleDOI
TL;DR: In this paper, the authors evaluate the impact of voids on thermal conductivity of a macro solder joint formed between a copper cylinder and a copper plate by using reflow soldering.
Abstract: The purpose of the paper is to experimentally evaluate the impact of voids on thermal conductivity of a macro solder joint formed between a copper cylinder and a copper plate by using reflow soldering.,A model of a surface mount device (SMD) was developed in the shape of a cylinder. A copper plate works as a printed circuit board (PCB). The resistor was connected to a power supply and the plate was cooled by a heat sink and a powerful fan. A macro solder joint was formed between a copper cylinder and a copper plate using reflow soldering and a lead-free solder paste SAC305. The solder paste was printed on a plate through stencils of various apertures. It was expected that various apertures of stencils will moderate the various void contents in solder joints. K-type thermocouples mounted inside cylinders and at the bottom of a plate underneath the cylinders measured the temperature gradient on both sides of the solder joint. After finishing the temperature measurements, the cylinders were thinned by milling to thickness of about 2 mm and then X-ray images were taken to evaluate the void contents. Finally the tablets were cross-sectioned to enable scanning electron microscopy (SEM) observations.,There was no clear dependence between thermal conductivity of solder joints and void contents. The authors state that other factors such as intermetallic layers, microcracks, crystal grain morfologyof the interface between the solder and the substrate influence on thermal conductivity. To support this observation, further investigations using metallographic methods are required.,Results allow us to assume that the use of SAC305 alloy for soldering of components with high thermal loads is risky. The common method for thermal balance calculation is based on the sum of serial thermal resistances of mechanical compounds. For these calculations, solder joints are represented with bulk SAC305 thermal conductivity parameters. Thermal conductivity of solder joints for high density of thermal energy is much lower than expected. Solder joints’ structure is not fully comparable with bulk SAC305 alloy. In experiments, the average value of the solder joint conductivity was found to be 8.1 W/m·K, which is about 14 per cent of the nominal value of SAC305 thermal conductivity.

Journal ArticleDOI
TL;DR: In this article, the authors investigated the effect of carbon nanotubes (CNTs) on the intermetallic growth of Sn-Ag-Cu solders and found that the addition of CNTs increased the activation energy from 97.86 to 101.45 kJ/mol.
Abstract: The purpose of this study is to investigate the addition of 0.05 Wt.% carbon nanotube (CNT) into the Sn-1.0Ag-0.5Cu (SAC) solder on the intermetallic (IMC) growth. Lead-based solders play an important role in a variety of applications in electronic industries. Due to the toxicity of the lead in the solder, lead-free solders were proposed to replace the lead-based solders. Sn-Ag-Cu solder family is one of the lead-free solders, which are proposed and considered as a potential replacement. Unfortunately, the Sn-Ag-Cu solder faces some reliability problems because of the formation of the thick intermetallic compounds. So the retardation of intermetallic growth is prime important.,The solder joint was aged under liquid state aging with soldering time from 1 to 60 min.,Two types of intermetallics, which are Cu6Sn5 and Cu3Sn were observed under a scanning electron microscope. The morphology of Cu6Sn5 intermetallic transformed from scallop to planar type as the soldering time increases. The addition of carbon nanotube into the SAC solder has retarded the Cu6Sn5 intermetallic growth rate by increasing its activation energy from 97.86 to 101.45 kJ/mol. Furthermore, the activation energy for the Cu3Sn growth has increased from 102.10 to 104.23 kJ/mol.,The increase in the activation energy indicates that the growth of the intermetallics was slower. This implies that the addition of carbon nanotube increases the reliability of the solder joint and are suitable for microelectronics applications.

Journal ArticleDOI
TL;DR: In this paper, three sintering sequences, S(a), S(b) and S(c), have been designed for the double-side assembly of power module in order to investigate the crack and stress distribution.
Abstract: Purpose Crack and stress distribution on dies are key issues for the pressure-assisted sintering bonding of power modules. The purpose of this research is to build a relationship among stress distributions, sintering sequences and sintering pressures during the sintering processes. Design/methodology/approach Three sintering sequences, S(a), S(b) and S(c), have been designed for the double-side assembly of power module in this paper. Experiments and finite element method (FEM) analysis are conducted to investigate the crack and stress distribution. Findings The sintering sequence had significant effects on the crack generation in the chips during the sintering process under 30-MPa pressure. The simulation results revealed that the module sintered by S(a) showed lower chip stress than those by the other two sintering sequences under 30 MPa. In contrast, the chip stress is the highest when the sintering sequence follows S(b). The simulation results explained the crack generation and prolongation in the experiments. S(a) was recommended as the best sintering sequence because of the lowest chip stress and highest yield rate. Originality/value This study investigated the stress distributions of the double-side sintered power modules under different sintering pressures. Based on the results of experiments and FEM analysis, the best sintering sequence design is provided under various sintering pressures.

Journal ArticleDOI
TL;DR: In this article, the microstructure evolution, characteristics of melting and solidification and joining performance with Cu were investigated using scanning electron microscopy (SEM), electron probe microanalysis, differential scanning calorimetry (DSC) and mechanical testing.
Abstract: To explore substitutes for traditional Sn-Pb solder, Sn-20In-2.8Ag was considered because of its appropriate melting temperature, good reliability and high ductility at less than 100°C. However, the mechanical properties of Sn-20In-2.8Ag were not satisfactory. The reason for the poor mechanical properties of the Sn-20In-2.8Ag/Cu joint was revealed, and a way to solve the problem was found.,The microstructure evolution, characteristics of melting and solidification and joining performance with Cu were investigated using scanning electron microscopy (SEM), electron probe microanalysis, differential scanning calorimetry (DSC) and mechanical testing.,SEM results showed that the microstructure of Sn-20In-2.8Ag was composed of coarse dendritic Ag2In and γ phases, with Ag2In distributed at the grain boundaries. DSC measurements revealed that small amount of low temperature eutectic reaction, L → Ag2In + β + γ, occurred at 112.9°C. This reaction was caused by the segregation of indium, which is a process that has a strong driving force. In the lap-shear testing, a crack propagated along the grain boundary of the solder, and failure showed an intergranular fracture. This failure was connected with the three-phase eutectic and coarse Ag2In. Thus, to improve the mechanical properties, segregation of indium should be reduced and coarsening of Ag2In should be prevented.,The reason for the unsatisfactory mechanical properties of Sn-20In-2.8Ag was revealed via microstructural observations and solidification analysis, and the way to solve this problem was found.

Journal ArticleDOI
TL;DR: In this paper, the authors used the Malvern rheometer Bohlin CVO to evaluate the viscoelastic properties of the flux media exposed to different levels of solicitation and to determine its influence on the rheology of the solder paste.
Abstract: The aim of this paper is to characterize the rheological properties of the flux media exposed to different levels of solicitation and to determine its influence on the rheology of the solder paste. The data obtained experimentally are fundamental for the development of numerical models that allow the simulation of the printing process of printed circuit boards (PCB).,Rheological tests were performed using the Malvern rheometer Bohlin CVO. These experiments consist of the analysis of the viscosity, yield stress, thixotropy, elastic and viscous properties through oscillatory tests and the capacity to recover using a creep-recovery experiment. The results obtained from this rheological analysis are compared with the rheological properties of the solder paste F620.,The results have shown that the flux is viscoelastic in nature and shear thinning. The viscosity does not decrease with increasing solicitations, except in the case where the flow is withdrawn directly from the bottle. Even if the solder paste shows a thixotropic behavior, this is not the case of the flux, meaning that this property is given by the metal particles. Furthermore, the oscillatory tests proved that the flux presents a dominant solid-like behavior, higher than the solder paste, meaning that the cohesive/tacky behavior of the solder paste is given by the flux.,To complement this work, printing tests are required.,This work demonstrates the importance of the rheological characterization of the flux in order to understand its influence in the solder paste performance during the stencil printing process.

Journal ArticleDOI
TL;DR: In this paper, the authors investigate the wetting and interfacial properties of low Ag content quaternary lead-free solder alloys and show that the addition of 0.5, 1 and 2% Bi improves the performance of these alloys.
Abstract: This paper aims to invastigate of the wetting and interfacial properties of Sn-(3-x)Ag-0.5Cu-(x)Bi (x = 0.5, 1 and 2 in Wt.%) Pb-free solder alloys at various temperatures ( 250, 280 and 310°C) on Cu substrate in Ar atmosphere.,In this study, new Sn-(3-x)Ag-0.5Cu-xBi systems, low Ag content quaternary lead-free solder alloys, were produced by adding 0.5, 1 and 2% Bi to the near-eutectic SAC305 alloy. The wetting angles of three new alloys, Sn-2.5Ag-0.5Cu-0.5 Bi(SAC-0.5 Bi), Sn-2Ag-0.5Cu-1Bi(SAC-1Bi) and Sn-1Ag-0.5Cu-2Bi(SAC-2Bi) were measured by sessile drop technique on the Cu substrate in argon atmosphere.,In accordance with the interfacial analyses, intermetallic compounds of Cu3Sn, Cu6Sn5, and Ag3Sn were detected at the SAC-Bi/Cu interface. The results of wetting tests show that the addition of 1 Wt.% Bi improves the wetting properties of the Sn-3Ag-0.5Cu solder. The lowest wetting angle (θ) was obtained as 35,34° for Sn-2Ag-0.5Cu-1Bi alloy at a temperature of 310 °C.,This work was carried out with our handmade experiment set and the production of the quaternary lead-free solder alloy used in wetting tests belongs to us. Experiments were conducted using the sessile drop method in accordance with wetting tests.

Journal ArticleDOI
TL;DR: In this paper, a bimodal nano-silver paste with improved mechanical property and reliability was developed to improve the high-temperature stability and reliability of nano-silicon joints.
Abstract: Purpose This study aims to develop a bimodal nano-silver paste with improved mechanical property and reliability. Silicon carbide (SiC) particles coated with Ag were introduced in nano-silver paste to improve bonding strength between SiC and Ag particles and enhance high-temperature stability of bimodal nano-silver paste. The effect of sintering parameters such as sintering temperature, sintering time and the proportion of SiC particles on mechanical property and reliability of sintered bimodal nano-silver structure were investigated. Design/methodology/approach Sandwich structures consist of dummy chips and copper substrates with nickel and silver coating bonded by nano-silver paste were designed for shear testing. Shear strength testing was conducted to study the influence of SiC particles proportions on the mechanical property of sintered nano-silver joints. The reliability of the bimodal nano-silver paste was evaluated experimentally by means of shear test for samples subjected to thermal aging test at 150°C and humidity and temperature testing at 85°C and 85 per cent RH, respectively. Findings Shear strength was enhanced obviously with the increase of sintering temperature and sintering time. The maximum shear strength was achieved for nano-silver paste sintered at 260°C for 10 min. There was a negative correlation between the proportion of SiC particles and shear strength. After thermal aging testing and humidity and temperature testing for 240 h, the shear strength decreased a little. High-temperature stability and high-hydrothermal stability were improved by the addition of SiC particles. Originality/value Submicron-scale SiC particles coated with Ag were used as alternative materials to replace part of nano-silver particles to prepare bimodal nano-silver paste due to its high thermal conductivity and excellent mechanical property.

Journal ArticleDOI
TL;DR: In this article, the authors used a novel technique, which is thermo-compression bonding, and Sn-1.0Ag-0.5Cu solder to form a full intermetallic compound (IMC) Cu3Sn joints (Cu/Cu3Sn/Cu joints).
Abstract: This paper used a novel technique, which is thermo-compression bonding, and Sn-1.0Ag-0.5Cu solder to form a full intermetallic compound (IMC) Cu3Sn joints (Cu/Cu3Sn/Cu joints). The purpose of the study is to form high-melting-point IMC joints for high-temperature power electronics applications. The study also investigated the effect of temperature gradient on the microstructure evolution and the growth behavior of IMCs.,In this paper, the thermo-compression bonding technique was used to form full Cu3Sn joints.,Experimental results indicated that full Cu/Cu3Sn/Cu solder joints with the thickness of about 5-6 µm are formed in a short time of 9.9 s and under a low pressure of 0.016 MPa at 450°C by thermo-compression bonding technique. During the bonding process, Cu6Sn5 grew with common scallop-like shape at Cu/SAC105 interfaces, which was followed by the growth of Cu3Sn with planar-like shape between Cu/Cu6Sn5 interfaces. Meanwhile, the morphology of Cu3Sn transformed from a planar-like shape to wave-like shape until full IMCs solder joints were eventually formed during thermo-compression bonding process. Asymmetrical growth behavior of the interfacial IMCs was also clearly observed at both ends of the Cu/SAC105 (Sn-1.0Ag-0.5Cu)/Cu solder joints. Detailed reasons for the asymmetrical growth behavior of the interfacial IMCs during thermo-compression bonding process are given. The compound of Ag element causes a reduction in Cu dissolution rate from the IMC into the solder solution at the hot end, inhibiting the growth of IMCs at the cold end.,This study used the thermo-compression bonding technique and Sn-1.0Ag-0.5Cu to form full Cu3Sn joints.

Journal ArticleDOI
TL;DR: In this paper, a combined material model was established which can follow the measured, apparent viscosity values with lower error, which can be applied for subsequent simulations via the described UDF, e.g. in the numerical modelling of the stencil printing process.
Abstract: The purpose of this paper is to present the establishment of a computational fluid dynamics model for investigating different non-Newtonian rheological models of solder pastes by simulating solder paste viscosity measurement. A combined material model was established which can follow the measured, apparent viscosity values with lower error.,The model included a parallel plate arrangement of rheometers. The diameter of the plate was 50 mm, whereas the gap between the plates was 0.5 mm. Only one quarter of the plate was modelled to enable using fine enough mesh, while keeping the calculation time low. Non-Newtonian properties were set using user defined function in Ansys, based on the Cross and Carreau–Yasuda material models. The viscosity values predicted by the mathematical models were compared to measured viscosity values of different types of solder pastes.,It was found that the Cross model predicts the apparent viscosity with a relatively high error (even approximately 50 per cent) at lower shear rates, whereas the Carerau–Yasuda model has higher errors at higher shear rates. The application of the proposed, combined model can result in a much lower error in the apparent viscosity between the calculated and measured viscosity values.,The error of Cross and Carreau–Yasuda material models has not been investigated yet in details. The proposed, combined material model can be applied for subsequent simulations via the described UDF, e.g. in the numerical modelling of the stencil printing. This can result in a more accurate modelling of the stencil printing process, which is inevitable considering the printing of solder paste for today fine-pitch, small size components.

Journal ArticleDOI
TL;DR: A review of the recent developments in vapour phase soldering (VPS) technology is presented in this paper, where the most important advantages and disadvantages of VPS technology compared to the other reflow soldering methods, as well as points out the necessary further developments and possible research directions.
Abstract: Purpose This paper aims to present a review of the recent developments in vapour phase soldering (VPS) technology. This study focuses on the following topics: recent developments of the technology, i.e. soft and vacuum VPS; measurement and characterization methods of vapour space, i.e. temperature and pressure; numerical simulation of the VPS soldering process, i.e. condensate layer and solder joint formation; and quality and reliability studies of the solder joints prepared by VPS, i.e. void content and microstructure of the solder joints. Design/methodology/approach This study was written according to the results of a wide literature review about the substantial previous works in the past decade and according to the authors’ own results. Findings Up to now, a part of the electronics industry believes that the reflow soldering with VPS method is a significant alternative of convection and infrared technologies. The summarized results of the field in this study support this idea. Research limitations/implications This literature review provides engineers and researchers with understanding of the limitations and application possibilities of the VPS technology and the current challenges in soldering technology. Originality/value This paper summarizes the most important advantages and disadvantages of VPS technology compared to the other reflow soldering methods, as well as points out the necessary further developments and possible research directions.

Journal ArticleDOI
TL;DR: In this article, an artificial neural network-based prediction method was established, which is able to predict the position of chip resistors after soldering as a function of component misplacement prior to soldering.
Abstract: This paper aims to investigate the self-alignment of 0603 size (1.5 × 0.75 mm) chip resistors, which were soldered by infrared or vapour phase soldering. The results were used for establishing an artificial neural network for predicting the component movement during the soldering.,The components were soldered onto an FR4 testboard, which was designed to facilitate the measuring of the position of the components both prior to and after the soldering. A semi-automatic placement machine misplaced the components intentionally, and the self-alignment ability was determined for soldering techniques of both infrared and vapour phase soldering. An artificial neural network-based prediction method was established, which is able to predict the position of chip resistors after soldering as a function of component misplacement prior to soldering.,The results showed that the component can self-align from farer distances by using vapour phase method, even from relative misplacement of 50 per cent parallel to the shorter side of the component. Components can self-align from a relative misplacement only of 30 per cent by using infrared soldering method. The established artificial neural network can predict the component self-alignment with an approximately 10-20 per cent mean absolute error.,It was proven that the vapour phase soldering method is more stable from the component’s self-alignment point of view. Furthermore, machine learning-based predictors can be applied in the field of reflow soldering technology, and artificial neural networks can predict the component self-alignment with an appropriately low error.

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TL;DR: In this paper, a decision tree is used to extract the key attributes of the circuit board assembly process yield and association rules are used to determine the relevance of key attributes for undesirable phenomena.
Abstract: This paper aims to consider the practical production environment of electronics manufacturing industry firms, and the large quantities of information collected on machine processes, testing data and production reports, while simultaneously taking into account the properties of the processing environment, in conducting analysis to obtain valuable information.,This research constructs a prediction model of the circuit board assembly process yield. A decision tree is used to extract the key attributes. The authors also integrate association rules to determine the relevance of key attributes of undesirable phenomena.,The results assure the successful application of the methodology by reconfirming the rules for solder skip and short circuit occurrence and their causes.,Measures for improvement are recommended, production parameters determined and debugging suggestions made to improve the process yield when the new process is implemented.