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Journal ArticleDOI

A Novel Model of Reliability Assessment for Circular Electrical Connectors

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TLDR
In this paper, an approach combining laboratory accelerated degradation testing (ADT) and PoF modeling is proposed for effectively assessing connector reliability, where random vibration and current stress are selected as acceleration factors that affect the contact life of electrical connectors.
Abstract
The reliability of circular electrical connectors was usually assessed according to standards like MIL-HDBK-217 (Reliability Prediction of Electronic Equipment). Given to their limitations and mislead results, a new assessment method needs to be presented. Some concerns on the physics of failure (PoF) modeling and reliability assessment of circular electrical connectors are addressed in this paper to overcome this defect. An original approach combining laboratory accelerated degradation testing (ADT) and PoF modeling is proposed for effectively assessing connector reliability. Random vibration and current stress are selected as acceleration factors that affect the contact life of electrical connectors. Then, an appropriate multiple-stresses ADT scheme is derived. The PoF model for electrical connectors under multiple stresses yielded the generalized Eyring relationship. According to the system reliability model for multiposition connectors, connectors’ life follows Weibull distribution, which is derived from extreme-value distribution theory. Through ADT and data gained from tests, statistical analysis result yielded the estimated value of reliability character of MIL-C-38999 I series electrical connectors under the action of vibration and current stresses.

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Book

Reliability Engineering

TL;DR: RelReliability as mentioned in this paper is a comprehensive reference for practitioners and professionals in quality and reliability engineering, it can also be used for senior undergraduate or graduate courses in industrial and systems, mechanical, and electrical engineering programs.
Journal ArticleDOI

Accurate reliability inference based on Wiener process with random effects for degradation data

TL;DR: This paper proposes an exact procedure to test whether there is population heterogeneity and an exact confidence interval procedure for the diffusion parameter of the Wiener process, and generalized confidence intervals are proposed for model parameters and some commonly used reliability metrics.
Journal ArticleDOI

Remaining useful life prediction of aviation circular electrical connectors using vibration-induced physical model and particle filtering method

TL;DR: A new remaining useful life (RUL) prediction method is presented, aimed at the mechanism of increasing oxide film thickness induced by vibration, which leads to an increase in contact resistance, based on failure mechanisms and particle filters.
Journal ArticleDOI

Modeling and Analysis of Performance Degradation Data for Reliability Assessment: A Review

TL;DR: ADT fundamentals are presented, including the basic theory, ADT methods, accelerated stress variables, type of acceleration models, as well as ADT optimization, to comprehensively review current states and future challenges in degradation modeling.
Journal ArticleDOI

A combined physics of failure and Bayesian network reliability analysis method for complex electronic systems

TL;DR: A new approach that combines a physics of failure (PoF) method and a copula Bayesian network to assess complex electronic systems is proposed and can guide the improvement of system reliability and system maintenance.
References
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Journal ArticleDOI

Stochastic models for degradation-based reliability

TL;DR: In this article, a degradation-based procedure for estimating the full and residual lifetime distribution of a single unit system subject to Markovian deterioration is presented, which unifies real degradation measures with analytical, stochastic failure models to numerically compute the distributions and their moments.
Book

Reliability Engineering

TL;DR: RelReliability as mentioned in this paper is a comprehensive reference for practitioners and professionals in quality and reliability engineering, it can also be used for senior undergraduate or graduate courses in industrial and systems, mechanical, and electrical engineering programs.
Proceedings ArticleDOI

Enhancing MIL-HDBK-217 reliability predictions with physics of failure methods

James McLeish
TL;DR: The Defense Standardization Program Office (DSPO) has initiated a multiphase effort to update MIL-HDBK-217 (217), the military's often imitated and frequently criticized reliability prediction bible for electronics equipment.
Proceedings ArticleDOI

Reliability quantification of induction motors-accelerated degradation testing approach

TL;DR: In this paper, a degradation index, the Orbit Area (OA), for small induction motors is proposed, which turns out to be one of the most reliable indices for time tracking motor bearing wear.
Book

Electronic connector handbook : theory and applications

TL;DR: In this paper, the authors present an overview of the contact interface and contact physics for Connectors, including the contact spring material, contact wire, and the permanent connection between wire and cable.