Proceedings ArticleDOI
A Scanning Acoustic Microscope
Ross A. Lemons,Calvin F. Quate +1 more
- pp 18-21
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This article is published in Internaltional Ultrasonics Symposium.The article was published on 1973-01-01. It has received 76 citations till now. The article focuses on the topics: Physical acoustics & Scanning acoustic microscope.read more
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Journal ArticleDOI
Material Characterization by Line-Focus-Beam Acoustic Microscope
J.-I. Kushibiki,N. Chubachi +1 more
TL;DR: In this article, a nouvelle methode de caracterisation tres precise des materiaux is proposed, in which the caracteristiques de propagation des ondes de fuite a la limite entre l'eau et l'echantillon; the vitesse de phase and l'attenuation sont determinees a travers des mesures de la courbe V(z).
Journal Article
Considerations on a laser-scanning-microscope with high resolution and depth of field.
Christoph Cremer,Thomas Cremer +1 more
TL;DR: Possibility to develop a "laser-scanning-microscope" on the basis of available techniques (laser microirradiation, miniprocessors, light detecting systems, automatic focusing, holographic focusing etc.) are discussed.
Journal ArticleDOI
Acoustic microscopy—1979
L.W. Kessler,D.E. Yuhas +1 more
TL;DR: A review of the techniques and their applications is presented in this paper, with a focus on the applications of acoustic microscopy for both biomedical and materials technology, as well as their applications.
Journal ArticleDOI
Fundamentals of Digital Ultrasonic Processing
C.F. Schueler,Hua Lee,G. Wade +2 more
TL;DR: In this paper, the authors present three techniques d'imagerie clefs: representation d'intensite, imagerie par une methode d'echo-impulsion and methodes de phase-amplitude comprenant l'holographie and la tomographie.
Journal ArticleDOI
Scanning acoustic microscopy
TL;DR: In this article, the scanning acoustic microscope (SAM) operating principle and the various system configurations available are discussed. And various applications are covered, including biological applications, integrated circuits, composite materials and metrology.