Proceedings ArticleDOI
ADC built-in-self-test based on a pseudorandom uniform noise generator
Guiomar Evans
- pp 1-5
TLDR
The proposed ADC BIST system is based in a uniform histogram approach to test the linearity of ADCs and shows that the error on the maximum INL is 0.13 LSB for the Mersenne twister pseudorandom uniform noise generator.Abstract:
This paper describes a digital built-in-self-test (BIST) solution to ADC dynamic performance testing. The proposed ADC BIST system is based in a uniform histogram approach to test the linearity of ADCs. A pipeline ADC with a resolution of 10 bits, a DAC with the same resolution as the ADC under test and the proposed BIST scheme were modeled and simulated in MATLAB to prove its validity. Several 32 bits pseudorandom uniform noise generators were evaluated. When compared with the Gaussian histogram approach, the obtained results show that the error on the maximum INL is 0.13 LSB for the Mersenne twister pseudorandom uniform noise generator and an adequate statistical significance is obtained with a quarter of the samples. Additionally, the number and complexity of the circuits are reduced.read more
Citations
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Proceedings ArticleDOI
A digital pseudorandom uniform noise generator for ADC built-in self-test
TL;DR: The results show that an adequate statistical significance is obtained for the 10 bits ADC and this test can be done with just 1/4 of the samples if a digital UNG is used instead of a Gaussian noise generator.
Proceedings ArticleDOI
Digital pseudorandom uniform noise generators for ADC histogram test
TL;DR: The obtained results shown that the histogram test with an UNG as a stimulus could be a powerful method to characterize 10 bits ADCs with the accuracy needed.
Proceedings ArticleDOI
Testing of an 8-bit Sigma Delta ADC Based on Code Width Technique Using 45nm Technology
Yogita Tembhre,Anil Kumar Sahu +1 more
TL;DR: A novel design is exhibited in the paper presented here for an analog-to-digital converter (ADC) built-in self test (BIST) scheme using code-width technique and an 8-bit sigma-delta ADC BIST scheme is introduced.
Proceedings ArticleDOI
Arbitrary waveform generator based on the Berlekamp-Massey Algorithm
TL;DR: An arbitrary waveform generator based on the Berlekamp-Massey Algorithm modified to operate in the Real field and results for different waveforms generated by the proposed generator are showed.
Proceedings ArticleDOI
A chaotic switched-capacitor circuit for characteristic CMOS noise distributions generation
TL;DR: A switched-capacitor circuit is proposed for the generation of noise resembling the typical noise spectral density of MOS devices, based on the combination of two chaotic maps.
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