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Journal ArticleDOI

Annealing behavior of electroplated permalloy thin films

R. L. Anderson, +2 more
- 01 May 1973 - 
- Vol. 2, Iss: 1, pp 161-176
TLDR
The isochronal annealing behavior of electroplated 1.2 µm Ni-Fe thin films containing 80 wt% Ni, in the temperature range from 373° to 773°K, and with a magnetic field parallel to the easy axis of the films, was investigated in this paper.
Abstract
The isochronal annealing behavior of electroplated 1.2 µm Ni-Fe thin films containing nominally 80 wt% Ni, in the temperature range from 373° to 773°K, and with a magnetic field parallel to the easy axis of the films, was investigated through measurements of the films’ structural, magnetic and electrical properties. The effects of annealing could be described in terms of two annealing stages. In stage I, occurring up to about 575°K, recovery took place along with some pairordering, resulting in small decreases in the coercivity, the easy axis dispersion and the electrical resistivity; the apparent anisotropy field increased in this stage. The stage II of annealing, occurring above 575°K, was characterized by more defect annealing, a change in the texture and possibly some long-range ordering. This stage resulted in increases in the coercivity and the dispersion, along with decreases in the apparent anisotropy field, the apparent strain sensitivity and the relative permeability. The results of both annealing stages are discussed in terms of the structural changes.

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Journal ArticleDOI

Micromachined planar inductors on silicon wafers for MEMS applications

TL;DR: The micromachined on-chip inductors can be applied for magnetic microelectromechanical systems devices, such as micromotors, microactuators, microsensors, and integrated power converters, which envisages new micropower magnetics on a chip with integrated circuits.
Journal ArticleDOI

Strain-relaxation in thin films on substrates

A Gangulee
- 01 Feb 1974 - 
TL;DR: In this paper, an analysis of strain relaxation in thin films on substrates is presented, which can adequately be described in terms of three mechanisms, namely diffusion creep, grain boundary sliding and plastic deformation through dislocation glide.
Journal ArticleDOI

Batch fabrication of thin film magnetic recording heads: A literature review and process description for vertical single turn heads

TL;DR: In this article, the authors describe a fabrication process for single turn thin film heads of vertical configuration, which utilizes well known evaporation, plating, and photolithographic techniques.
Journal ArticleDOI

Annealing of thin magnetoresistive permalloy films

TL;DR: The figure of merit of magnetoresistive permalloy thin films, which are commonly used for bubble domain sensors, is shown to improve considerably after annealing treatments as mentioned in this paper.
References
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Journal ArticleDOI

III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

TL;DR: In this article, two basic equations are derived for deducing the dislocation density in powdered materials from the particle size and strain breadth measured from the Debye-Schemer spectrum.
Journal ArticleDOI

Measurement of sheet resistivities with the four-point probe

TL;DR: In this paper, correction factors are evaluated for the measurement of sheet resistirities on two-dimensional rectangular and circular samples with the four-point probe, and the factors are also useful in obtaining body resistivities on thin samples.
Journal ArticleDOI

X-ray studies of deformed metals

TL;DR: Experimental techniques and data on x-ray-diffraction studies of cold- worked metals are reviewed in this article, where the effects of small coherent domains and strains upon the powder pattern of a material are discussed.
Journal ArticleDOI

A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder Photographs

A. R. Stokes
TL;DR: In this article, the corrected distribution of intensity across an x-ray diffraction line was derived using Fourier analysis, and the procedure was illustrated by a numerical example. But the method may also be of use in spectrum analysis and statistical problems.
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