Journal ArticleDOI
Birefringence of muscovite mica
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TLDR
In this article, a different procedure is adopted to measure birefringence directly as a single quantity in terms of the thicknesses of mica plates and the wavelengths at which they act as quarterwave or halfwave phase retarders.Abstract:
Birefringence of muscovite mica (ne−no) is usually calculated from the dispersion relations of the indices ne and no. As small differences between relatively large experimentally-measured values, the few available data for birefringence of mica are widely distinct and sometimes contradict basic experimental facts. A different procedure is adopted in this work to measure birefringence directly as a single quantity in terms of the thicknesses of mica plates and the wavelengths at which they act as quarterwave or halfwave phase retarders. Birefringence is found to decrease gradually from −0.0040 at 420 nm to −0.0046 at 700 nm in conformity with pertinent independent experimental results.read more
Citations
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Journal ArticleDOI
High contrast optical detection of single graphenes on optically transparent substrates
TL;DR: In this article, the authors demonstrate that optical reflection mode imaging with single graphenes on the bottom of a bare transparent substrate such as mica can provide a high contrast of more than 12% for visible light.
Journal ArticleDOI
High accuracy FIONA–AFM hybrid imaging
D.N. Fronczek,Cory Quammen,Hong Wang,Caroline Kisker,Richard Superfine,Russell M. Taylor,Dorothy A. Erie,Ingrid Tessmer +7 more
TL;DR: A combination of the two orthogonal techniques (FIONA and AFM) opens a wide spectrum of possible applications to the study of protein interactions, because AFM can yield high resolution information about the conformational properties of multi-protein complexes and the fluorescence can indicate spatial relationships of the proteins in the complexes.
Journal ArticleDOI
Retardation characteristics and birefringence of a multiple-order crystalline quartz plate
N N Nagib,S.A Khodier,H M Sidki +2 more
TL;DR: In this paper, the birefringence (ne−no) of crystalline quartz was calculated as a single quantity and varied from 0.00971 at 370 nm to 0.00891 at 794 nm.
Journal ArticleDOI
Phase retardometer: a proposed device for measuring phase retardance.
TL;DR: A proposed device that meets these requirements and simple formulas for retardance measurements are presented.
Journal ArticleDOI
Simultaneous spectral calibration of two phase plates
TL;DR: In this paper, a new model for the spectral calibration of phase plates in pairs was proposed and the experimental results for three mica plates between 430 and 684 nm were presented.
References
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Book
Handbook of Optical Constants of Solids
TL;DR: In this paper, E.D. Palik and R.R. Potter, Basic Parameters for Measuring Optical Properties, and W.W.Hunter, Measurement of Optical Constants in the Vacuum Ultraviolet Spectral Region.
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Achromatic and apochromatic halfwave and quarterwave retarders
TL;DR: In this paper, a theoretical analysis is presented leading to a systematic procedure for choosing a combination of materi- als that minimizes the residual variation of the retardation with wave length.
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Method for measuring the retardation of a wave plate
TL;DR: An electro-optic modulator applied to a carrier frequency is used to measure the retardation of a wave plate and is suitable for any wave plate but also can be operated in real time.
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A theoretical and experimental analysis of the ellipsometer
TL;DR: A theoretical analysis of the problem of determining ψ and Δ from instrument readings is made for two commonly used ellipsometer geometries in this article, where the significance of the different zones of measurement and the effects due to multiple internal reflections in the retardation plate are emphasized resulting in an unambiguous, exact set of formulae.
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Ellipsometry Using a Retardation Plate as Compensator
TL;DR: In this article, the authors derived the equations of ellipsometry relating the specimen properties, ρ=tanψeiΔ, to the instrument settings P, A, and Q. The treatment differs from previous works in that both of the important parameters of the retardation plate are considered, namely, the retardations δ and the transmission ratio T, of the slow to the fast axis.