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Chemical states of implanted ions in an oxide crystal
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TLDR
The chemical states of implanted copper and bismuth in an oxide crystal were investigated by using X-ray photoelectron spectroscopy (XPS) in this article, where metal ions were implanted into strontium titanate single crystals with a fluence of 1 × 1016 ions/cm2 at an energy of 150 keV.Abstract:
The chemical states of implanted copper and bismuth in an oxide crystal were investigated by using X-ray photoelectron spectroscopy (XPS). Metal ions were implanted into semiconductive strontium titanate single crystals with a fluence of 1 × 1016 ions/cm2 at an energy of 150 keV. Subsequently oxygen ions were implanted with the appropriate fluences and energies to fit the depth profiles to those of implanted metals. Chemical states of ions were determined by XPS with sputter-etching. The state of implanted Cu which was Cu0 in the as-implanted sample could be changed to Cu1+ by the post-annealing at 800°C in air or by the co-implantation of oxygen. The state of implanted Bi which was Bi0 in the samples as-implanted, post-annealed, and oxygen co-implanted could be changed to Bi3+ by the co-implantation of oxygen followed by heating. Electrical properties were also measured.read more
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Ion-beam mixing in an immiscible Fe/Ag multilayer film
S. Amirthapandian,B. K. Panigrahi,Avanish Kumar Srivastava,Sandip Dhara,Ajay Gupta,V. S. Sastry,R. V. Nandedkar,K.G.M. Nair,A. Narayanasamy +8 more
TL;DR: In this paper, the evolution of microstructure is studied by x-ray diffraction (XRD), X-ray reflectivity, and transmission electron microscopy (TEM).
Journal ArticleDOI
Bismuth doping of silicon compatible thin films for telecommunications and visible light emitting devices
TL;DR: In this paper, the structural and optical properties of erbium doped yttrium silicates and oxides were investigated and the advantages of using bismuth as Er co-dopant, as a strategy to improve optical efficiency at 1540nm, wavelength of interest for telecommunications.
Journal ArticleDOI
Damage and thermal annealing of In+ implanted a-axis sapphire
TL;DR: In this article, single crystal samples of α-Al2O3 were implanted with 100 keV and 360 keV indium ions to doses of 6 × 1016ions/cm2, 1 × 101 6ions/ cm2, and 3 × 606ions/m2, respectively, at room temperature (RT).
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RBS/NRA/channeling analysis of implanted immiscible species
TL;DR: In this paper, the induced lattice damage and the lattice location of implanted Cu atoms were analyzed by 2.7 MeV 4He+ RBS/channeling, and the results suggest that 12C atoms are aligned along Ir 〈1 0 0 0〉 direction at least by low temperature implantation followed by thermal annealing.
References
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Journal ArticleDOI
Mechanism of buried β-SiC formation by implanted carbon in silicon
TL;DR: In this article, the structure of silicon implanted with high doses of carbon ions in the range (0.35-1.3) × 10 18 C + cm −2 at implantation temperatures from 500 to 700 °C is studied by transmission electron microscopy.
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Formation of oxygen-deficient type structural defects and state of ions in SiO2 glasses implanted with transition metal ions
TL;DR: The properties and concentrations of oxygen-deficient type structural defects in type III SiO 2 glasses implanted with Ti +, Cr +, Mn +, Fe +, or Cu + to doses from 0.5×10 16 to 6×100 16 ions/cm 2 at an energy of 160 keV have been measured by using vacuum UV and EPR spectroscopies as discussed by the authors.
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Friction changes in ion-implanted steel
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Modification of metallic corrosion by ion implantation
TL;DR: A review of the properties of surface alloys, formed by ion implantation, which are effective in modifying corrosion behavior can be found in this article, where examples of the modification of the corrosion behavior of pure metals, steels and other engineering alloys resulting from implantation with metals and metalloids are given.
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Ion beam modification of glass surface properties
TL;DR: In this paper, a general review of the effects of defects induced by ion implantation of silicate and fluoride glasses is presented, including H decoration of defects and compositional changes due to internal electric field formation and preferential sputtering.