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Journal ArticleDOI

Development and vapour pressure of metallo-organic precursors of copper for the deposition of copper thin films by a plasma-assisted MOCVD

TLDR
A group of metallo-organic complexes of copper, namely bis(N-R-salicylaldiminato)Cu(II) (R: methyl to n-pentyl, hereafter referred to as 1-5) were prepared and their volatile nature was confirmed by TG/DTA as discussed by the authors.
Abstract
A group of metallo-organic complexes of copper, namely bis(N-R-salicylaldiminato)Cu(II) (R: methyl to n-pentyl, hereafter referred to as 1–5) were prepared and their volatile nature was confirmed by TG/DTA. The molecular masses (M) of 1–5 were confirmed by mass spectrometry. The vapour pressure (pe) for precursors 1–5 determined by a transpiration technique using the Clausius–Clapeyron relation yielded the values of 91 ± 2, 84 ± 4, 100 ± 2, 92 ± 2, and 72 ± 2 kJ mol−1 for ΔHovap, respectively, for 1–5. The thin films deposited by plasma-assisted MOCVD technique contain predominantly metallic copper in orientation. The SEM images of the thin films exhibit continuous nanoball-like structure.

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Thermodynamic Study of Iridium(I) Complexes as a Basis for Chemical Gas-Phase Deposition Technology

TL;DR: In this article, experimental data on the saturated vapor pressure and melting of DICBonyl (hexafluoroacetylacetonato) and iridium compounds were obtained.
References
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Journal ArticleDOI

An introduction to Cu electromigration

TL;DR: Basic electromigration physics is reviewed in which the main differences between Al- and Cu-based interconnects relevant to electromigration are covered and the methodology of electromigration lifetime extrapolation, including reliability assessments of more complex interconnect geometries, is covered.
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Metallization and nanostructuring of semiconductor surfaces by galvanic displacement processes

TL;DR: In this paper, a brief review of the fundamental aspects underlying galvanic displacement processes on semiconductor surfaces is presented, including applications to micro and nanoscale devices, including schemes developed for the metallization and nanopatterning of semiconductor substrates with high selectivity and with optimal interfacial properties.
Journal ArticleDOI

Molecular design of improved precursors for the MOCVD of electroceramic oxides

TL;DR: In this article, the molecular design of a number of new oxide precursors is described, illustrating how the replacement of simple alkoxide groups by other groups, such as donor-functionalised alkoxide or β-diketonate ligands, can result in a precursor with improved physical properties and enhanced MOCVD performance.
Journal ArticleDOI

Copper(I), silver(I) and gold(I) carboxylate complexes as precursors in chemical vapour deposition of thin metallic films

TL;DR: In this article, a new class of volatile precursors for chemical vapour deposition (CVD) of metallic layers is described, which can be divided into three types: inorganic, coordination and organometallic.
Journal ArticleDOI

Low-temperature atomic layer deposition of copper metal thin films: self-limiting surface reaction of copper dimethylamino-2-propoxide with diethylzinc.

TL;DR: A uniform, conformal, pure copper metal thin film was grown at very low substrate temperatures (100-120 degrees C) on Si(100) substrates by atomic layer deposition involving the ligand exchange of [Cu(OCHMeCH(2)NMe(2))(2)] with Et( 2)Zn (see scheme).
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