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Proceedings ArticleDOI

Fundamental Noise Studies of Quartz Crystal Resonators

J.J. Gagnepain
- pp 84-91
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This article is published in Annual Symposium on Frequency Control.The article was published on 1976-06-02. It has received 58 citations till now. The article focuses on the topics: Noise temperature & Resonator.

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Citations
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Proceedings ArticleDOI

A new model of 1/f noise in BAW quartz resonators

TL;DR: In this article, a model for predicting 1/f (flicker) frequency noise in quartz resonators as a function of the unloaded resonator quality factor Q and volume under the electrodes for bulk acoustic wave (BAW) resonators is presented.
Journal ArticleDOI

Flicker noise measurement of HF quartz resonators

TL;DR: The interferometric method appears to be the best choice to measure the phase fluctuations of the quartz resonators because of its high sensitivity in the low power conditions, which is required for this type of resonator.
Journal ArticleDOI

Low-noise power-efficient oscillators: theory and design

TL;DR: In this paper, a linear theory with experimental verification is proposed to show how the spectrum of a high-efficiency oscillator varies with the amplifier noise figure (F), the voltage gain of the amplifier (G), the unloaded quality factor of the resonator (Qo), the loaded quality factor (QL), and the total RF power in the oscillating system (PFED).
Proceedings ArticleDOI

Excess Noise in Quartz Crystal Resonators

TL;DR: In this article, the frequency and phase noise in quartz crystal resonators were studied as a function of the driving power of the crystal and the crystal's nonlinearities were found to increase phase fluctuations at low Fourier frequencies.
References
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Journal ArticleDOI

Measurement of the Short-Term Stability of Quartz Crystal Resonators and the Implications for Crystal Oscillator Design and Applications

TL;DR: In this paper, a new technique is presented which makes it possible to measure the inherent short-term stability of quartz crystal resonators in a passive circuit, and it is shown that with this improved shortterm stability it should be feasible to multiply a crystal controlled source to 1 THz and obtain a linewidth of less than 1 Hz.
Journal ArticleDOI

Excess noise in semiconducting devices due to fluctuations in their characteristics when signals are applied

TL;DR: In this paper, the authors describe the frequency spectra of unobserved excess noise obtained when small signals are applied to transistors and semiconducting diodes and resistors, expressed as a ratio of the difference between the noise with and without signals to the noise without signals, Δθ/θ0.