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Patent

Gate-coupled MOSFET ESD protection circuit

Shi-Tron Lin, +1 more
TLDR
In this paper, a gate-coupled MOSFET ESD protection circuit was proposed, where a pulldown element is included to form a voltage divider like circuit, such that the gate-node potential is limited to around 1 to 2 volts during a positive ESD transient event.
Abstract
A gate-coupled MOSFET ESD protection circuit. The circuit has a gate-node potential controlled by an inverter and a timing control circuit. Unlike current-shunting ESD clamping devices that turn the MOSFET fully on during an ESD event, a pull-down element is included to form a voltage divider like circuit, such that the gate-node potential is limited to around 1 to 2 volts during a positive ESD transient event. Unlike GCNMOS (Gate-Coupled NMOS), the invention has better control of the transient gate potential for more effective triggering of the NMOS into snapback during an ESD event.

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Citations
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TL;DR: In this article, the authors proposed a method for protecting against electrostatic discharge by configuring a gate of at least one upper transistor of a transistor network connected between power rails to be biased to a prescribed value.
References
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Patent

Schmitt trigger-configured ESD protection circuit

TL;DR: A Schmitt trigger-configured overvoltage protection circuit has a hysteresis turn-on, turn-off characteristic that minimizes its sensitivity to noise, and is effective to protect an integrated circuit against a DC over-voltage condition, and electrostatic discharge-based transients, while allowing hot insertion of a device containing the clamping circuit into an already powered-up system.
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Voltage level triggered ESD protection circuit

TL;DR: In this article, a voltage level triggered ESD protection circuit is proposed, which does not consume any DC current either in the powered up or powered down states, and is interfaceable to a live bus when the system it is connected to is powered down.