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Journal ArticleDOI

Logic design verification via test generation

M.S. Abadir, +2 more
- 01 Jan 1988 - 
- Vol. 7, Iss: 1, pp 138-148
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TLDR
A method for logic design verification is introduced in which a gate-level implementation of a circuit is compared with a functional-level specification and it is shown that the class of design errors that can be detected is very large.
Abstract
A method for logic design verification is introduced in which a gate-level implementation of a circuit is compared with a functional-level specification. In this method, test patterns that were developed to detect single stuck-line faults in the gate-level implementation are used instead to compare the gate-level implementation with the functional-level specification. In the presence of certain hypothesized design errors, such a test set will produce responses in the implementation that disagree with the responses in the specification. It is shown that the class of design errors that can be detected in this way is very large. >

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Citations
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BookDOI

Correct Hardware Design and Verification Methods

TL;DR: Theorem Proving Related Approaches Formal Synthesis at the Algorithmic Level and a Method of Comparison between Specification and Implementation are presented.
Journal ArticleDOI

Fault diagnosis and logic debugging using Boolean satisfiability

TL;DR: This work proposes a novel Boolean satisfiability-based method for multiple-fault diagnosis and multiple-design-error diagnosis in combinational and sequential circuits and suggests that satisfiability captures significant characteristics of the problem of diagnosis.
Journal ArticleDOI

Model-based diagnosis of hardware designs

TL;DR: An approach to employ model-based diagnosis for fault detection and localization in very large V HDL programs, by automatically generating the diagnosis model from the VHDL code and using observations about the program behavior to derive possible fault locations from the model is described.
Journal ArticleDOI

Diagnosis and reliable design of digital systems

D.C. King
TL;DR: It's coming again, the new collection that this site has, and the favorite diagnosis and reliable design of digital systems book is offered as the choice today.
Proceedings ArticleDOI

Native mode functional test generation for processors with applications to self test and design validation

TL;DR: This work presents a versatile automatic functional test generation methodology for microprocessors that can be applied to both design validation and manufacturing test, especially in high speed "native" mode.
References
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Journal ArticleDOI

Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

TL;DR: Two algorithms are presented: one, DALG-II, computes a test to detect a failure in acyclic logic circuits; the other, TEST-DETECT, ascertains all failures detected by a given test.
Book

Automated reasoning: Introduction and applications

TL;DR: This book explains what automated reasoning is and what it can do and then demonstrates how to use it to solve complex problems with applications in logic circuit design, circuit validation, real-time system design and expert systems.
Journal ArticleDOI

Diagnosis and reliable design of digital systems

D.C. King
TL;DR: It's coming again, the new collection that this site has, and the favorite diagnosis and reliable design of digital systems book is offered as the choice today.
Proceedings ArticleDOI

Bristle Blocks: A Silicon Compiler

TL;DR: The Bristle Block system is an attempt to create a silicon compiler that will perform the majority of the implementation computation while placing a minimum set of constraints on the designer.
Proceedings ArticleDOI

Symbolic Manipulation of Boolean Functions Using a Graphical Representation

TL;DR: A data structure for representing Boolean functions and an associated set of manipulation algorithms represented by directed, acyclic graphs in a manner similar to the representations of Lee and Akers, but with further restrictions on the ordering of decision variables in the graph.
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