Proceedings ArticleDOI
Measurement of In-Plane Strain with Shearography and Electronic Speckle Pattern Interferometry for Composite Materials
Amalia Martínez-García,Juan-Antonio Rayas-Alvarez,Raul R. Cordero +2 more
- pp 187-191
TLDR
In this article, experimental results obtained by applying both technique, Electronic Speckle Pattern Interferometry (ESPI) and Electronic Spearle Pattern Shearing Interference (ESPSI), were compared in the study of composite materials.Abstract:
Experimental results obtained by applying both technique, Electronic Speckle Pattern Interferometry (ESPI) and Electronic Speckle Pattern Shearing Interferometry (ESPSI) were compared in the study of composite materials. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI in turn allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured by an additional method.read more
Citations
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Dissertation
Modal testing using high speed digital speckle pattern interferometry
TL;DR: This thesis introduces the application of a high-speed speckle pattern interferometer (SPI) to perform quantified impact modal testing and applied the SPI to the novel measurement of traveling waves on a centre-clamped disc.
References
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Book
Holographic Interferometry: Principles and Methods
TL;DR: In this article, the Fourier transform diffraction theory computer-aided tomography Bessel functions are used to evaluate interference phase processing of the interference phase speckle metrology.
Journal ArticleDOI
Measuring displacement derivatives by electronic speckle pattern shearing interferometry (ESPSI)
TL;DR: In this paper, the authors proposed a general procedure to compensate the shearing error and to introduce the reference by adding two quantities to the values rendered by ESPSI, which can be used to measure displacement derivatives.
Journal ArticleDOI
Measurement of in-plane strains using electronic speckle and electronic speckle-shearing pattern interferometry
TL;DR: In this article, the first-order partial derivatives of in-plane displacements were determined by using the electronic speckle and electronic specckle-shearing pattern interferometry.
Journal ArticleDOI
Error in the measurement due to the divergence of the object illumination wavefront for in-plane interferometers
TL;DR: In this article, an in-plane configuration for electronic speckle pattern interferometer (ESPI) is used for a flat and cylindrical object surface target and theoretical analysis and experimental results for object divergent and collimated illumination are presented.