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Method for fabricating metal oxide field effect transistors

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TLDR
In this article, a polysilicon layer is used to prevent the gate oxide film from being etched upon forming a gate electrode using a metal film or metal silicide side walls as a mask.
Abstract
A method for fabricating a metal oxide silicon field effect transistor (MOSFET) wherein a polysilicon layer is deposited over a gate oxide film serving to insulate the gate of the MOSFET from the substrate of the MOSFET. The polysilicon layer serves to prevent the gate oxide film from being etched upon forming a gate electrode using a metal film or metal silicide side walls as a mask. Accordingly, it is possible to prevent a short circuit from occurring between the semiconductor substrate and gate electrode of the MOSFET upon forming the gate electrode.

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Citations
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TL;DR: In this article, a pattern of mandrels is first formed overlying a semiconductor substrate, and spacers are then formed on the sidewalls of the mandrel by depositing a blanket layer of material over the mandrells and preferentially removing spacer material from horizontal surfaces.
References
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Patent

Method of manufacturing semiconductor device having polycrystalline silicon layer with metal silicide film

TL;DR: A metal silicide film is formed on the sides of a polycrystalline silicon layer formed on a semiconductor substrate via an insulating film, and the surface of the metal silicides film is covered by a silicon oxide film, whereby the silicon layer has a low electrical resistance and no shortcircuiting is necessary as discussed by the authors.
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Method of maufacturing a semiconductor device having a low resistance gate electrode

TL;DR: In this article, a gate-patterned polysilicon layer was used as an ion-implantation mask to form source/drain regions in the semiconductor substrate, on opposite sides of the gate electrode.
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Method for fabricating polycide gate MOSFET devices

TL;DR: In this paper, a method of fabricating MOSFET device with polycide gate, which includes a polysilicon layer and a refractory metal silicide layer, is described.
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MOSFET with a refractory metal film, a silicide film and a nitride film formed on and in contact with a source, drain and gate region

TL;DR: In this paper, a refractory metal barrier layer is provided by forming a self-aligned refractoric metal silicide layer and a two-layer selfaligned barrier is formed.
Patent

Semiconductor integrated circuit device with multiplayered wiring

TL;DR: In this paper, a semiconductor integrated circuit device capable of having a high integration density and excellent performance and a method of fabricating the semiconductor Integrated Circuit device are disclosed, where a connecting conductor for connecting gate wiring which is formed on a field oxide film and extended from the gate of a MOSFET, to the source/drain region of another MOSFLET is interposed between the gate wiring and one of two side space layers for defining the width of the gate wires.