scispace - formally typeset
Patent

Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry

TLDR
In this article, a wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub wavefronts is substantially contiguous with at least one other subwavefront.
Abstract
Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms. A computer connected to the imaging element measures various parameters of the objects based on the phase-shifted interferograms. Examples of measurements include flow parameters such as the concentrations of selected gaseous species, temperature distributions, particle and droplet distributions, density, and so on. In addition to flow parameters, the displacement (e.g., the vibration) and the profile of an object may be measured.

read more

Citations
More filters
Proceedings ArticleDOI

Pixelated Phase-Mask Dynamic Interferometer

TL;DR: In this article, a new type of dynamic measurement system that is comprised of a micropolarizer array and can work with any type polarization interferometer to measure a variety of physical properties is presented.
Patent

Apparatus for wavefront detection

TL;DR: An apparatus for wavefront detection includes a wavefront source for the production of a wave front, an optical system transforming the wavefront, a diffraction grating through which the transformed wavefront passes, and a spatially resolving detector following the grating as mentioned in this paper.
Journal ArticleDOI

One-shot phase-shifting phase-grating interferometry with modulation of polarization: case of four interferograms.

TL;DR: An experimental setup for optical phase extraction from 2-D interferogram extraction using a one-shot phase-shifting technique able to achieve four interferograms with 90 degrees phase shifts in between is presented.
Patent

Dual laser high precision interferometer

TL;DR: An absolute distance measuring device based on laser interferometry may combine coarse, intermediate, and highest resolution measurement techniques to find the absolute distance to a sample surface with high resolution as mentioned in this paper.
References
More filters
Journal ArticleDOI

Instantaneous Phase Measuring Interferometry

R. Smythe, +1 more
- 01 Aug 1984 - 
TL;DR: In this article, an instantaneous phase measuring interferometer (PMI) was proposed to measure displacements at one point to a resolution of 0.003 um, with a measurement time aperture of less than 1 As.
Patent

System and method for optically measuring a structure

TL;DR: In this article, an optical system and method that uses a polarized light beam, reflected off or transmitted through, a structure, to measure the structural parameters, such as the lateral dimensions, vertical dimensions, height, or the type of structural material.
Patent

Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms

TL;DR: In this paper, an optical system for measuring the topography of an object includes an interferometer (1) with a multiple-color or white-light source (4), a mechanical scanning apparatus (13) for varying the optical path difference between the object and a reference surface, a two-dimensional detector array (9), and digital signal processing apparatus (2) for determining surface height from interference data.
Patent

Apparatus and methods for surface contour measurement

TL;DR: In this paper, two sources of radiation having a spectral distribution and being coherent with respect to one another, a control system for moving each of the sources relative to each other, a detector positioned at the point on the surface of the object to receive radiation, and a processor for receiving signals from the detector.
Patent

Multi-spectral two-dimensional imaging spectrometer

TL;DR: In this paper, a multi-spectral two-dimensional imaging spectrometer includes a combination of achromatic, well-corrected lenses for imaging a 2D scene on an internal field stop.