Patent
Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
James E. Millerd,Neal Brock +1 more
TLDR
In this article, a wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub wavefronts is substantially contiguous with at least one other subwavefront.Abstract:
Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms. A computer connected to the imaging element measures various parameters of the objects based on the phase-shifted interferograms. Examples of measurements include flow parameters such as the concentrations of selected gaseous species, temperature distributions, particle and droplet distributions, density, and so on. In addition to flow parameters, the displacement (e.g., the vibration) and the profile of an object may be measured.read more
Citations
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Journal ArticleDOI
Interferometric fluorescent super-resolution microscopy resolves 3D cellular ultrastructure
Gleb Shtengel,James A. Galbraith,Catherine G. Galbraith,Jennifer Lippincott-Schwartz,Jennifer M. Gillette,Suliana Manley,Rachid Sougrat,Clare M. Waterman,Pakorn Kanchanawong,Michael W. Davidson,Richard D. Fetter,Harald F. Hess +11 more
TL;DR: iPALM closes the gap between electron tomography and light microscopy, enabling both molecular specification and resolution of cellular nanoarchitecture.
Proceedings ArticleDOI
Pixelated Phase-Mask Dynamic Interferometer
TL;DR: In this article, a new type of dynamic measurement system that is comprised of a micropolarizer array and can work with any type polarization interferometer to measure a variety of physical properties is presented.
Patent
Apparatus for wavefront detection
TL;DR: An apparatus for wavefront detection includes a wavefront source for the production of a wave front, an optical system transforming the wavefront, a diffraction grating through which the transformed wavefront passes, and a spatially resolving detector following the grating as mentioned in this paper.
Journal ArticleDOI
One-shot phase-shifting phase-grating interferometry with modulation of polarization: case of four interferograms.
Gustavo Rodriguez-Zurita,Cruz Meneses-Fabian,Noel-Ivan Toto-Arellano,J F Vázquez-Castillo,Carlos Robledo-Sanchez +4 more
TL;DR: An experimental setup for optical phase extraction from 2-D interferogram extraction using a one-shot phase-shifting technique able to achieve four interferograms with 90 degrees phase shifts in between is presented.
Patent
Dual laser high precision interferometer
TL;DR: An absolute distance measuring device based on laser interferometry may combine coarse, intermediate, and highest resolution measurement techniques to find the absolute distance to a sample surface with high resolution as mentioned in this paper.
References
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Journal ArticleDOI
Instantaneous Phase Measuring Interferometry
R. Smythe,R. Moore +1 more
TL;DR: In this article, an instantaneous phase measuring interferometer (PMI) was proposed to measure displacements at one point to a resolution of 0.003 um, with a measurement time aperture of less than 1 As.
Patent
System and method for optically measuring a structure
David Marx,Demetri Psaltis +1 more
TL;DR: In this article, an optical system and method that uses a polarized light beam, reflected off or transmitted through, a structure, to measure the structural parameters, such as the lateral dimensions, vertical dimensions, height, or the type of structural material.
Patent
Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms
TL;DR: In this paper, an optical system for measuring the topography of an object includes an interferometer (1) with a multiple-color or white-light source (4), a mechanical scanning apparatus (13) for varying the optical path difference between the object and a reference surface, a two-dimensional detector array (9), and digital signal processing apparatus (2) for determining surface height from interference data.
Patent
Apparatus and methods for surface contour measurement
TL;DR: In this paper, two sources of radiation having a spectral distribution and being coherent with respect to one another, a control system for moving each of the sources relative to each other, a detector positioned at the point on the surface of the object to receive radiation, and a processor for receiving signals from the detector.
Patent
Multi-spectral two-dimensional imaging spectrometer
TL;DR: In this paper, a multi-spectral two-dimensional imaging spectrometer includes a combination of achromatic, well-corrected lenses for imaging a 2D scene on an internal field stop.