Journal ArticleDOI
Modeling and Mitigating Single-Event Transients in Voltage-Controlled Oscillators
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TLDR
In this paper, an analytical model is presented to determine the VCO design parameters and the associated SET vulnerability, and radiation-hardened-by-design (RHBD) techniques to mitigate SETs in current-starved VCOs are presented.Abstract:
Voltage-controlled oscillators (VCOs) have been shown to dominate the single-event transient (SET) response of mixed-signal circuits such as the phase-locked loop (PLL). An analytical model is presented to determine the VCO design parameters and the associated SET vulnerability. Additionally, radiation-hardened-by-design (RHBD) techniques to mitigate SETs in current-starved VCOs are presented. The proposed mitigation techniques reduce the phase displacement in the output of the VCO following a single-event (SE) by approximately 66%. The availability of the analytical model and RHBD techniques will improve the SE performance of VCO and PLL designs to ensure a specified tolerance to SEs.read more
Citations
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Journal ArticleDOI
A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS
T. D. Loveless,Lloyd W. Massengill,Bharat L. Bhuva,W.T. Holman,Robert A. Reed,Dale McMorrow,Joseph S. Melinger,Phillip P. Jenkins +7 more
TL;DR: In this article, a phase-locked loop (PLL) was designed and fabricated in 130 nm CMOS to mitigate single-event transients (SETs), and two-photon-absorption (TPA) laser tests were used to characterize the error signatures of the PLL and to perform single event upset mapping of the sub-components.
Journal ArticleDOI
Comparison of a 65 nm CMOS Ring- and LC-Oscillator Based PLL in Terms of TID and SEU Sensitivity
TL;DR: In this article, a comparison has been made between a low-noise ring-oscillator and an LC-scillator phase-locked loop (PLL), and an ASIC has been developed to conduct irradiation experiments targeting high-energy physics applications.
Journal ArticleDOI
A Generalized Linear Model for Single Event Transient Propagation in Phase-Locked Loops
T. D. Loveless,Lloyd W. Massengill,W.T. Holman,Bharat L. Bhuva,Dale McMorrow,Jeffrey H. Warner +5 more
TL;DR: In this paper, a first-order linear model is formulated in closed-form for the examination of transient propagation through charge pump phase-locked loops (PLL), and a novel PLL design parameter is discovered as the primary factor influencing extraneous transient generation and propagation through the PLL independent of technology node.
Journal ArticleDOI
A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops
T. D. Loveless,Lloyd W. Massengill,Bharat L. Bhuva,W.T. Holman,M.C. Casey,Robert A. Reed,S.A. Nation,Dale McMorrow,Joseph S. Melinger +8 more
TL;DR: In this article, a voltage-controlled-oscillator (VCO) circuit was designed for radiation-hardened-by-design (RHBD) single-event transient (SET) mitigation.
Journal ArticleDOI
A 2.56-GHz SEU Radiation Hard $LC$ -Tank VCO for High-Speed Communication Links in 65-nm CMOS Technology
TL;DR: In this paper, a phase-locked loop CMOS integrated circuit with an optimized voltage controlled oscillator (VCO) for single-event upsets (SEUs) is presented.
References
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Journal ArticleDOI
Two-Photon Absorption, Nonlinear Refraction and Optical Limiting in Semiconductors
Eric W. Van Stryland,Herman Vanherzeele,M. A. Woodall,M. J. Soileau,Arthur L. Smirl,Shekhar Guha,Thomas F. Boggess +6 more
TL;DR: In this paper, the authors measured two-photon absorption coefficients of 10 direct gap semiconductors with band-gap energy Eg varying between 1.4 and 3.7 eV using 1.06 µm and 0.53 um picosecond pulses.
Journal ArticleDOI
Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
TL;DR: In this article, a subbandgap two-photon absorption is demonstrated and shown to be a viable alternative to the conventional single photon excitation approach in laser-induced single event effects.
Journal ArticleDOI
Simultaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalline silicon
TL;DR: In this paper, the authors reported the first simultaneous measurement of the two-photon absorption coefficient and the free-carrier cross section above the bandgap in a semiconductor, using a simple technique that does not require a knowledge of the actual carrier density.
Journal ArticleDOI
Analysis of single-event transients in analog circuits
P.C. Adell,Ronald D. Schrimpf,Hugh J. Barnaby,R. Marec,C. Chatry,P. Calvel,C. Barillot,O. Mion +7 more
TL;DR: In this article, a new methodology for understanding single-event transient (SET) phenomena in analog circuits is described, where device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit.
Journal ArticleDOI
Observation of single event upsets in analog microcircuits
R. Koga,S.D. Pinkerton,Steven C. Moss,D.C. Mayer,Stephen LaLumondiere,S.J. Hansel,K.B. Crawford,W.R. Crain +7 more
TL;DR: In this paper, the OP-15 operational amplifier has been found to be susceptible to single event upsets in the laboratory and has also experienced upset in space, and possible strategies for mitigating the occurrence of analog SEUs in space are also discussed.