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Arthur F. Witulski

Researcher at Vanderbilt University

Publications -  120
Citations -  5047

Arthur F. Witulski is an academic researcher from Vanderbilt University. The author has contributed to research in topics: Soft error & Buck converter. The author has an hindex of 34, co-authored 115 publications receiving 4413 citations. Previous affiliations of Arthur F. Witulski include University of Colorado Boulder & University of Arizona.

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Journal ArticleDOI

Ultrawide-Bandgap Semiconductors: Research Opportunities and Challenges

TL;DR: The UWBG semiconductor materials, such as high Al‐content AlGaN, diamond and Ga2O3, advanced in maturity to the point where realizing some of their tantalizing advantages is a relatively near‐term possibility.
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Charge Collection and Charge Sharing in a 130 nm CMOS Technology

TL;DR: In this paper, the authors examined key parameters affecting charge sharing and quantified relative collected charge at the hit node and adjacent nodes, and showed that for a twin-well CMOS process, PMOS charge sharing can be effectively mitigated with the use of contacted guard-ring, whereas a combination of contact guard ring, nodal separation and interdigitation is required to mitigate the NMOS charge-sharing effect for the technology studied.
Proceedings ArticleDOI

Large signal stability criteria for distributed systems with constant power loads

TL;DR: In this paper, design oriented criteria are developed for distributed power systems with constant power loads to guarantee stability during large disturbances, where design constraints on the input filter parameters, such as the Q factor, and the amount of "ideal" constant power load that a system can support are placed.
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Comparison of resonant topologies in high-voltage DC applications

TL;DR: In this paper, the series and parallel resonant topologies, as well as a newly discovered hybrid resonance topology are compared for high-voltage applications and it is found that the parallel topology leads to the lowest peak switch current and the most ideal behavior.
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Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

TL;DR: In this article, the distributions of SET pulse-widths produced by heavy ions in 130-nm and 90-nm CMOS technologies are measured experimentally using an autonomous pulse characterization technique.