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Journal ArticleDOI

Monte‐Carlo simulations of MBE growth of III–V semiconductors: The growth kinetics, mechanism, and consequences for the dynamics of RHEED intensity

S. V. Ghaisas, +1 more
- 01 Mar 1985 - 
- Vol. 3, Iss: 2, pp 540-546
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TLDR
In this paper, the role of surface molecular reaction kinetics associated with the dissociative chemisorption of the group V molecular specie is explicitly investigated for the first time and shown to lead to a new configurationdependent reactive incorporation (CDRI) growth process, quite distinct from the conventional notions of nucleation and continuous growth.
Abstract
Results of Monte Carlo simulations carried out to examine the nature of the growth mechanism in MBE of lattice matched III–V compounds are presented. The role of surface molecular reaction kinetics associated with the dissociative chemisorption of the group V molecular specie is explicitly investigated for the first time and shown to lead to a new configuration‐dependent‐reactive‐incorporation (CDRI) growth process, quite distinct from the conventional notions of nucleation and continuous growth. For very slow dissociative reaction kinetics the CDRI growth process is shown to lead to a reaction‐limited‐incorporation (RLI) growth mechanism and the accompanying growth rate exhibits oscillatory behavior. For fast dissociative reaction kinetics, accompanied with a sufficiently fast surface interlayer migration kinetics of the group III atoms, the CDRI growth process gives rise to a configuration‐limited‐reactive‐incorporation (CLRI) growth mechanism. The crystal growth rate once again exhibits oscillations. It is also shown that under conditions involving specially delicate balance between the various kinetic rates, growth can proceed without oscillations in the growth rate. An essentially layer‐by‐layer mode of material addition is realized in all the aforementioned cases. Consequences of the resulting growth front morphology for the time dependence of the RHEED specular beam intensity are investigated and shown to give rise to a damped oscillatory behavior, including in the absence of oscillations in the crystal growth rate.

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Book ChapterDOI

Introduction to the Kinetic Monte Carlo Method

TL;DR: The purpose of this chapter is to provide an introduction to this KMC method, by taking the reader through the basic concepts underpinning KMC and how it is typically implemented, assuming no prior knowledge of these kinds of simulations.
Journal ArticleDOI

Rheed studies of heterojunction and quantum well formation during MBE growth-from multiple scattering to band offsets

TL;DR: In this article, the basic concepts and first-order growth model derived from the RHEED intensity oscillation technique are described and the limitations imposed by the experimentally demonstrated multiple-scattering nature of the diffraction process are indicated.

RHEED Studies of Heterojunction and Quantum Well Formation during MBE Growth - from Multiple Scattering to Band Offsets

TL;DR: The basic concepts and first-order growth model derived from the RHEED intensity oscillation technique are described and the limitations imposed by the experimentally demonstrated multiple-scattering nature of the diffraction process are indicated.
Journal ArticleDOI

The nature of molecular beam epitaxial growth examined via computer simulations

TL;DR: In this paper, a variety of synthetic structures involving epitaxially grown thin films of one or more compound semiconductors have been finding an increasingly important role in semiconductor device technology.
Journal ArticleDOI

Dynamic effects in RHEED from MBE grown GaAs(001) surfaces

TL;DR: In this paper, high energy electron diffraction measurements of the intensity of (elastically) diffracted beams as a function of the incident angle have been carried out for an exactly oriented GaAs(001) surface, using a primary beam energy of 12.5 keV.
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