Proceedings ArticleDOI
Next generation eWLB (embedded wafer level BGA) packaging
Yonggang Jin,Xavier Baraton,S. W. Yoon,Yaojian Lin,Pandi C. Marimuthu,V. P. Ganesh,Thorsten Meyer,Andreas Bahr +7 more
- pp 520-526
TLDR
In this paper, the authors highlight some of the recent advancements in next generation eWLB technologies including multi-RDL, thin e-WLB and extra large eWLP as well as double-side with vertical interconnection.Abstract:
Demand for wafer level packaging (WLP) is being driven by the need to shrink package size and height, simplify the supply chain and provide a lower overall cost by using the infrastructure of a batch process. “Fan-in” (FI)-WLP typically has a limitation to be less than 6x6mm in order to pass board level reliability requirements such as drop test and temperature cycle due to the mismatch of Si material properties to the PCB. However, the “Fan-out” (FO)-WLP, has been developed and introduced into production to allow for higher ball count WLP, by extending the package size beyond the area of the chip. The most prominent type of FO-WLP is the eWLB technology (embedded Wafer Level Ball Grid Array). Currently 1st generation eWLB technology is available in the industry. This paper will highlight some of the recent advancements in next generation eWLB technologies including multi-RDL, thin eWLB and extra large eWLB as well as double-side with vertical interconnection. These key technologies of next generation eWLB enable 3D eWLB applications such as SoW (SiP on Wafer) and 3D SiP. 3D eWLB can be implemented with through silicon via (TSV) applications as well as discrete component embedding. The process flow of next generation eWLB fabrication, assembly and packaging challenges will be discussed. This paper will also present some of the achievements in package reliability, mechanical characterization and performance.read more
Citations
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Journal ArticleDOI
Integrating MEMS and ICs
Andreas Fischer,Fredrik Forsberg,Martin Lapisa,Simon J. Bleiker,Göran Stemme,Niclas Roxhed,Frank Niklaus +6 more
TL;DR: Traditional as well as innovative and emerging approaches to MEMS and IC integration are reviewed, including approaches based on the hybrid integration of multiple chips (multi- chip solutions) as wellAs system-on-chip solutions based on wafer-level monolithic integration and heterogeneous integration techniques.
Journal ArticleDOI
Integrating MEMS and ICs
Andreas Fischer,Fredrik Forsberg,Martin Lapisa,Simon J. Bleiker,Göran Stemme,Niclas Roxhed,Frank Niklaus +6 more
TL;DR: There are a variety of possible methods of integrating and packaging MEMS and IC components, and the technology of choice strongly depends on the device, the field of application and the commercial requirements.
Proceedings ArticleDOI
Development of High Density Fan Out Wafer Level Package (HD FOWLP) with Multi-layer Fine Pitch RDL for Mobile Applications
Vempati Srinivasa Rao,Chai Tai Chong,David Ho,Ding Mian Zhi,Chong Ser Choong,Sharon Lim Ps,Daniel Ismael,Ye Yong Liang +7 more
TL;DR: In this article, Fan-out Wafer Level Packaging (FOWLP) has been proposed as a promising technology to meet the ever increasing demands of the consumer electronic products.
Proceedings ArticleDOI
Modeling and design solutions to overcome warpage challenge for fan-out wafer level packaging (FO-WLP) technology
TL;DR: In this article, a methodology to reduce the warpage of a 12" wafer at different processes was proposed in terms of geometry design, material selection, and process optimization through finite element analysis (FEA) and experiment.
Proceedings ArticleDOI
Large area compression molding for Fan-out Panel Level Packing
Tanja Braun,S. Raatz,S. Voges,R. Kahle,V. Bader,J. Bauer,K.-F. Becker,T. Thomas,Rolf Aschenbrenner,Klaus-Dieter Lang +9 more
TL;DR: Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics as discussed by the authors, which is currently done on wafer level up to 12″/300 mm diameter.
References
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Proceedings ArticleDOI
Embedded wafer level ball grid array (eWLB)
TL;DR: In this paper, Infineon's embedded Wafer level Ball Grid Array (WLB) technology is presented, which allows fitting interconnects onto a so-called fan-out area extending the chip area.
Proceedings ArticleDOI
Embedded Wafer Level Ball Grid Array (eWLB)
TL;DR: In this article, Infineon's embedded Wafer Level Ball Grid Array (WLB) technology, which allows fitting interconnects onto a so-called fan-out area extending the chip area, is presented.
Proceedings ArticleDOI
3D TSV processes and its assembly/packaging technology
TL;DR: Demand for Through Silicon Via (TSV) is being driven by the need for 3D stacking to shorten interconnection length, increase signal speed, reduce power consumption and reduce power dissipation.
Proceedings ArticleDOI
A 77 GHz SiGe mixer in an embedded wafer level BGA package
TL;DR: In this article, the authors present a fully operational 77 GHz SiGe mixer assembled in a chip-scale embedded wafer level BGA (eWLB) package, which has a footprint with a standard pad pitch of 0.5 mm.
Journal ArticleDOI
Good things in small packages
TL;DR: We rely on our mobile devices for an almost comically long list of functions: talking, texting, Web surfing, navigating, listening to music, taking photos, watching and making videos.